Vector network analyzer supporting multi-port parallel testing

Abstract

The invention provides a vector network analyzer supporting multi-port parallel testing. The vector network analyzer creates one or more sub-instruments in a time division multiplexing mode, the number of the sub-instruments corresponds to the number of ports of the vector network analyzer, and the vector network analyzer sequentially scans the sub-instruments connected with the ports according toan internal sequence; when the user establishes connection with the sub-instruments, the vector network analyzer maintains the connection and mapping relationship between the user and the sub-instruments, and when the user issues an SCPI command from different connections, the vector network analyzer distributes the SCPI command to the corresponding sub-instruments for execution according to theconnection relationship. According to the invention, one vector network analyzer device can be divided into a plurality of devices for use, the device utilization rate is improved, and the device procurement cost of a client is also reduced; on the basis, a C / S framework is adopted in the vector network analyzer, display and data processing are separated, and therefore simultaneous operation of multiple users can be supported.

Description

technical field [0001] The invention relates to a vector network analyzer, in particular to a vector network analyzer supporting multi-port parallel testing. Background technique [0002] A vector network analyzer (VNA) is an expensive analytical instrument and a measuring instrument used to measure radio frequency and microwave devices. The VNAs currently on the market only support single-user operation, that is to say, they can only be used by one person at a time. If the factory has multiple production lines, in order to test each production line in parallel, at least one VNA must be purchased for each production line, which greatly increases the production cost of the customer. [0003] VNA generally has multiple test ports, such as 2 ports and 4 ports, etc., such as figure 2 As shown, the test process of the two-port DUT is as follows: the tester connects the 1 port and 2 port of the DUT to the 1 port and 2 port of the VNA respectively; starts the test, and the VNA di...

AI Technical Summary

Problems solved by technology

[0004]Figure Ports 3 and 4 of the 4-port VNA shown in 2 have not been used, but since ordinary VNAs only support one user operation, if ports 3 and 4 are assigned to another tester, the ports 3 and 4 When port 4 starts testing, port 1 and port 2 cannot be used

If testing a 1-port DUT, 2-port, 3-port, and 4-port cannot be used in parallel

To support concurrent testing, customers need to purchase multiple VNAs, and the required purchase cost is also huge

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