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A method and system for automatic calibration of chip radio frequency signal delay measurement parameters

A radio frequency signal, automatic calibration technology, applied in the field of electronic communication, can solve the problems of calibration failure and low factory efficiency, achieve the best factory efficiency, save labor costs, and improve the effect of low factory efficiency

Active Publication Date: 2021-03-23
ASR MICROELECTRONICS (SHENZHEN) CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of this, the embodiments of the present disclosure provide an automatic calibration method and system for chip radio frequency signal delay measurement parameters, which can improve the problems of low factory efficiency or calibration failure caused by the existing unreasonable delay parameter setting

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  • A method and system for automatic calibration of chip radio frequency signal delay measurement parameters
  • A method and system for automatic calibration of chip radio frequency signal delay measurement parameters
  • A method and system for automatic calibration of chip radio frequency signal delay measurement parameters

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specific Embodiment

[0075] The first time to measure the technical indicators under the steady state of the chip:

[0076] 1. Set the initial value according to the type of index to be measured: Delay time for the first measurement: =800ms; Interval time of index measurement: T2=0.5s; Power average error threshold: ΔE=2%; Power variance reference multiple: k=1.5; Measurement times under the same delay time: N=10.

[0077] 2. The time control module in the control module sends an instruction to start measurement to the chip control module.

[0078] 3. The chip control module controls the module chip to send radio frequency signals.

[0079] 4. The time control module sends a read instruction to the instrument control and RF acquisition module after a delay of T1.

[0080] 5. The instrument control module controls the measuring instrument to receive the index measurement value of the radio frequency signal at that moment, and the RF acquisition module receives the measurement value from the inst...

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Abstract

The present invention provides an automatic calibration method and system for measuring parameters of chip radio frequency signal delay. The system includes: a control module, a module and a measuring instrument. The measuring instrument is used to measure the radio frequency signal emitted by the module. The control module is used to control the module to emit and / or stop emitting specified radio frequency signals, and to control the measuring instrument to start and / or stop measuring, and to read the measured value of the measuring instrument. Using this system can automatically measure the starting time of the radio frequency chip module stably transmitting radio frequency signals at a certain frequency. The method for automatically calibrating the time provided by the present invention can find out the time starting point of radio frequency signal stable transmission, thereby ensuring radio frequency Under the premise of stable signal index, use the least time delay to provide the best factory efficiency.

Description

technical field [0001] The present disclosure relates to the technical field of electronic communication, in particular to an automatic calibration method and system for measuring parameters of chip radio frequency signal delay. Background technique [0002] Modules with RF functions need to be calibrated for RF parameters when they leave the factory. The calibration values ​​of RF calibration will be written into the designated position of the chip, which is used for the chip to work with ideal RF indicators in official work. For example, the radio frequency parameters of chips such as WiFi, BLE, ZIGBEE, GNSS, LORA, and NB-IOT. [0003] At present, the calibration of chip radio frequency signal delay measurement parameters is usually set by the upper computer calibration tool to set a fixed value, or manually calibrated according to different chip manufacturers, different batches and different channel frequencies. Therefore, the existing parameter calibration method has th...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/21H04B17/24H04B17/11
CPCH04B17/21H04B17/24H04B17/11
Inventor 祖东辉刘大伟刘森
Owner ASR MICROELECTRONICS (SHENZHEN) CO LTD