Adversarial sample generation method, system and apparatus for outlier removal method

A technology against samples and outliers, applied in the field of image recognition, which can solve the problems of accurate classification and poor robustness that cannot meet the requirements of high security requirements.

Active Publication Date: 2021-07-06
INST OF AUTOMATION CHINESE ACAD OF SCI
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the above-mentioned problems in the prior art, the existing image classification model based on deep learning adopts conventional adversarial examples for training, which has poor robustness and cannot meet the precise classification requirements in fields with extremely high security requirements. Problem, the present invention provides an adversarial sample generation method for the outlier removal method, the method includes:

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Adversarial sample generation method, system and apparatus for outlier removal method
  • Adversarial sample generation method, system and apparatus for outlier removal method
  • Adversarial sample generation method, system and apparatus for outlier removal method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0047] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, not to limit the invention. It should also be noted that, for the convenience of description, only the parts related to the related invention are shown in the drawings.

[0048] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0049] The present invention provides a method for generating an adversarial sample for an outlier removal method. The method includes:

[0050] Step S100, acquiring 3D point cloud data with category labels;

[0051] Step S200, input the 3D point cloud data into the 3D point cloud ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the field of image recognition, and specifically relates to an adversarial sample generation method, system and device for outlier removal methods, aiming to solve the problem that the adversarial samples used in the existing deep learning-based classification model training cannot The method of removing outliers makes image classification errors, resulting in the problem of poor robustness and low accuracy of the trained classification model. The present invention includes: obtaining a training data set with a class label, inputting three-dimensional point cloud data into a classification model and calculating a classification loss, respectively calculating the gradient of the classification loss on the three-dimensional point cloud data and the three-dimensional point cloud data on removing outliers The gradient of the two gradients is multiplied by the scaling factor to generate fusion perturbation, and the fusion perturbation is applied to the three-dimensional point cloud data to iteratively generate adversarial samples. The adversarial samples generated by the invention can still cause image classification errors under the condition of removing outliers, which improves the robustness and classification accuracy of the trained model.

Description

technical field [0001] The invention belongs to the field of image recognition, and in particular relates to an adversarial sample generation method, system and device for outlier removal methods. Background technique [0002] The 3D point cloud classification model based on deep learning has been greatly developed in recent years, and it can achieve a classification accuracy of about 90% on the ModelNet40 dataset. But at the same time, in the field of image classification, the classification model based on deep learning is vulnerable to the attack of adversarial samples. From the appearance, the adversarial samples are almost the same as the normal samples, but the adversarial samples will make the classification model make mistakes. However, there are few studies on adversarial examples in the field of 3D point cloud, and the field of 3D point cloud classification is related to engineering projects with high security requirements such as automatic driving and machine grasp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/62G06K9/40
CPCG06V10/30G06F18/24G06F18/214
Inventor 马成丞孟维亮徐士彪郭建伟吴保元张晓鹏
Owner INST OF AUTOMATION CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products