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Time delay measurement method, device, system and storage medium

A time-delay measurement and time-delay technology, applied in the field of image processing, can solve problems such as low precision and poor effect, and achieve the effect of improving positioning accuracy, improving precision and improving effect

Active Publication Date: 2022-08-02
ALIBABA GRP HLDG LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, in practical applications, the effect of using the collected images for subsequent processing is poor, for example, the positioning accuracy of smart devices using the collected images is low, etc.

Method used

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  • Time delay measurement method, device, system and storage medium
  • Time delay measurement method, device, system and storage medium
  • Time delay measurement method, device, system and storage medium

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Embodiment Construction

[0032] In order to make the objectives, technical solutions and advantages of the present application clearer, the technical solutions of the present application will be clearly and completely described below with reference to the specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of this application.

[0033] In order to solve the technical problem that the time when the image is collected by the existing image acquisition device is inconsistent with the determined image acquisition time, in some embodiments of the present application, a time delay measurement system is provided. In combination with the object, the image acquisition module se...

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Abstract

Embodiments of the present application provide a time delay measurement method, device, system, and storage medium. In the embodiment of the present application, a control module synchronized with the clock of the image acquisition module is adopted, and the control module controls the reference object to adjust its state to a specified state at the corresponding control time during the process of collecting the image of the reference object by the image acquisition module; and then The delay parameter can be calculated according to the time stamp carried by the collected target image of the reference object in the specified state and the control time for adjusting the reference object to the specified state, so that the delay parameter can be used to control the time of the subsequently collected images in the future. Calibration with stamps helps to improve the time stamp accuracy of the images collected by the image acquisition module, which in turn helps to improve the effect of subsequent image-based processing, such as improving the positioning accuracy based on these images.

Description

technical field [0001] The present application relates to the technical field of image processing, and in particular, to a time delay measurement method, device, system and storage medium. Background technique [0002] With the continuous development of image processing technology, more and more devices are provided with image acquisition devices for acquiring images and implementing other functions according to the acquired images. For example, in the field of artificial intelligence, smart devices use the collected images for positioning or navigation, etc. [0003] However, in practical applications, the effect of using the collected images for subsequent processing is poor, for example, the accuracy of positioning the smart device using the collected images is low, and so on. SUMMARY OF THE INVENTION [0004] Various aspects of the present application provide a time delay measurement method, device, system, and storage medium, which are used to improve the time stamp ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00H04N5/232
CPCH04N17/002H04N23/60
Inventor 林晨续立军赵远东李名杨
Owner ALIBABA GRP HLDG LTD