Radio frequency module test system based on high-speed AD

Abstract

The invention relates to the technical field of communication equipment and discloses a radio frequency module test system based on a high-speed AD. The system comprises a tested radio frequency module and a high-speed AD module; the high-speed AD module collects an output signal of the tested radio frequency module and carries out analog-to-digital conversion on the output signal; the data outputend of the high-speed AD module is electrically connected to a data processing module; the data processing module comprises an external clock input port and a reference clock output port, wherein theexternal clock input port is electrically connected with a crystal oscillator circuit; and the data processing module generates a reference clock signal through a system clock provided by the crystaloscillator circuit and outputs the reference clock signal through the reference clock output port. Modularized programming of signal processing is achieved through an FPGA, so that the structure of the system is simplified, and convenience is provided for technology research and development and function expansion. The stable reference clock is output through the FPGA, so that the sampling precision of the high-speed AD module is ensured; and the FPGA module performs data transmission with the high-speed AD module through a PCIe interface, so that the efficiency of the data transmission is high.

Description

technical field [0001] The invention relates to the technical field of communication equipment, in particular to a high-speed AD-based radio frequency module testing system. Background technique [0002] In order to ensure the working performance of the radio frequency module, in the test of the radio frequency, it is necessary to sample the radio frequency information through high-speed AD. The existing high-speed AD module has the following problems in the test: [0003] The sampling rate of a high-precision ADC is not high, and the key to testing is to have a high-precision signal source. The high-speed ADC test is a more challenging task, and the Jitter of the sampling clock and the high-speed digital interface are two difficult problems that must be faced. [0004] A. Jitter (jitter) problem of sampling clock [0005] As the input signal and sampling frequency increase, the jitter carried by the sampling clock of the ADC affects the test results to a large extent, mak...

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Problems solved by technology

[0009] The present invention proposes a high-speed AD-based radio frequency module test system, which solves the problem of complex structure of the radio frequency test system in the prior art

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