Motion controller accelerated degradation test method based on acceleration factor

Abstract

The invention discloses a motion controller accelerated degradation test method based on an acceleration factor. The motion controller accelerated degradation test method comprises the following steps: step 1, designing a motion controller accelerated degradation test scheme; step 2, puttinga sample into a temperature test box for testing, and the like. The method is characterized in that the pulse width difference of the output signal is used as a test index of performance degradation of a motion controller, the temperature is used as acceleration stress, and the performance degradation process of the motion controller is modeled by using performance data obtained in a short-time acceleration test, so that the reliability and the service life of the motion controller under normal conditions are predicted. According to the method, the failure process of the motion controller under normal conditions can be reflected, an acceleration test is carried out with a large acceleration coefficient, the test time is shortened, and a feasible technical method is provided for research on the degradation life of the motion controller.

Description

technical field [0001] The invention belongs to an accelerated degradation test method for electronic products, in particular to an accelerated degradation test method for a motion controller based on an acceleration factor. Background technique [0002] The motion controller is a special controller that controls the operation mode of the motor. It can usually be constructed with a single-chip microcomputer, a microcomputer processor, a dedicated chip, a DSP based on a PC bus, and an FPGA as a core processor. The control scheme and planning instructions are converted into the desired mechanical motion, and the precise position control, speed control, acceleration control, torque or force control of mechanical motion is realized. During the working process of the motion controller, its failure is mainly due to the performance degradation of chips, integrated circuits, optocouplers, power output and other devices, so that the output accuracy cannot meet the requirements of use...

AI Technical Summary

Problems solved by technology

At present, there have been researches on product life prediction by introducing accelerated degradation test, and it has been successfully applied in prod

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