Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for measuring spherical curvature radius

A technology of curvature radius and measured surface, which is applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problem of not being able to obtain the size of the radius of curvature

Active Publication Date: 2020-12-11
SICHUAN UNIV
View PDF7 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] At the same time, none of the above measurement methods can obtain the radius of curvature of each point on the measured spherical surface, only the average radius of curvature parameter can be obtained

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for measuring spherical curvature radius
  • Method for measuring spherical curvature radius
  • Method for measuring spherical curvature radius

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The present invention will be described in more detail below in conjunction with the accompanying drawings and specific embodiments. It is necessary to point out that the following examples are only used for further description of the present invention, and cannot be interpreted as limiting the protection scope of the present invention, and those skilled in the art make some non-essential improvements to the present invention according to the above-mentioned content of the present invention And adjustments still belong to the protection scope of the present invention.

[0023] attached figure 1 The sinusoidal stripes are displayed on the middle LCD display, which are respectively reflected by the reference plane mirror and the spherical surface to be tested, and captured by the CCD pinhole camera. The camera pinhole coordinates C(Xc,Yc), and the display coordinates S1(Xs1,Ys1) and S2(Xs2,Ys2) of a ray reflected by a plane and a sphere, where the display coordinates are...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for measuring curvature radiuses of different points on a spherical surface by using a phase measurement deflection technology. According to the method, an LCD displayis adopted to display sine stripes, the stripes are reflected by a spherical element to be measured and then captured by a pinhole camera, and in known pinhole coordinates of a CCD camera, light rayswhich correspond to CCD camera pixels and pass through pinholes are reflected by a reference plane and the spherical element to be measured to intersect at the coordinates on the LCD display in the Z-direction position of the reference plane; parameters such as the spatial position of the spherical surface and the coordinate of the measured surface are obtained by using minimum angle condition optimization and an iterative method, and then the curvature radius distribution of the spherical surface is obtained by using a differential geometry method. According to the method, the curvature radius of each point on the spherical surface can be rapidly and accurately measured.

Description

technical field [0001] The invention relates to a method for measuring the distribution of curvature radius of a spherical surface. On the basis that the curvature radii of the partial areas of the spherical surface to be measured are equal, the parameters such as the coordinates of the measured surface of the spherical surface are obtained by using mathematical methods such as minimum angle condition optimization and iteration, and then obtained by means of differential geometry. Background technique [0002] The radius distribution of curvature can intuitively understand the quality of component processing and the areas that need improvement. In the manufacturing process of high-precision optical components, inspection has always been a reason for restricting the processing quality. Therefore, accurate measurement methods are the guarantee of the processing quality of optical components. At present, the common methods of measuring the radius of curvature mainly include me...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/255
CPCG01B11/255
Inventor 李大海洪铁鑫刘肖萧张新伟王瑞阳刘鑫
Owner SICHUAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com