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Chip testing device and chip testing method

A chip testing and chip technology, which is applied in the field of chip testing devices, can solve the problems of poor reusability of automation tools and various testing tools, and achieve the effects of good scalability, accelerated progress, and strong versatility

Inactive Publication Date: 2020-12-18
BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the embodiments of the present invention is to provide a chip testing device and a chip testing method, to at least solve the above-mentioned problems of a large number of testing tools in the chip and poor reusability of automation tools

Method used

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  • Chip testing device and chip testing method
  • Chip testing device and chip testing method

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Embodiment Construction

[0028] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0029] In order to achieve the above object, the first aspect of the present invention provides a chip testing device, the testing device includes:

[0030] A test equipment library for generating corresponding test signals;

[0031] The underlying function library is encapsulated with an interface function library and a data processing function library corresponding to the test equipment library;

[0032] A keyword library, which is encapsulated with keywords for calling, and the keywords are in one-to-one correspondence with the algorithms in the interface function library and the data processing function library;

[0033] The business application layer is u...

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Abstract

The invention provides a chip testing device and a chip testing method, and belongs to the field of chip testing. The test device comprises a test equipment library; an interface function library anda data processing function library corresponding to the test equipment library are packaged in the bottom layer function library; keywords used for calling are packaged in the keyword library; a service application layer which is used for storing, executing and writing a test function module, and the service application layer calls test logic formed by the keyword library through the test functionmodule; and combining and calling algorithms in the interface function library and the data processing function library to drive equipment corresponding to the test equipment library to generate corresponding test signals so as to test the chip. According to the invention, the automatic test of the chip is completed through the test device, and the test development progress of the chip is accelerated.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a chip testing device and a chip testing method. Background technique [0002] With the rapid development of chip design and manufacturing technology, the complexity of chips has been greatly improved, and the workload of chip sample testing has increased dramatically. Traditional manual testing cannot complete a large number of concurrent tasks, automatically process test tasks and data, and has a large amount of repetitive labor, often resulting in missed tests due to human factors. Automated testing can well standardize the testing process, avoid problems in manual testing, and improve testing efficiency. [0003] Existing chip test technology has many test tools and poor reusability of automation tools. Scattered test tools also cause test data to be scattered. Manual participation is still required for tool operations and data processing, which is inefficient and causes manpower...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/26G06F11/36G01R31/28
CPCG01R31/2851G01R31/2856G06F11/26G06F11/3672
Inventor 魏斌成嵩窦志军王栋徐靖林金锐
Owner BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY
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