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Method and device for acquiring product defect location distribution

A defect location, product defect technology, applied in measuring devices, optical testing flaws/defects, analyzing materials, etc., can solve problems such as slow speed and low efficiency, and achieve the effect of improving data processing performance

Active Publication Date: 2021-02-23
CHANGZHOU MICROINTELLIGENCE CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This processing method has the defects of low efficiency and slow speed, especially in the batch processing of product defect data

Method used

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  • Method and device for acquiring product defect location distribution
  • Method and device for acquiring product defect location distribution
  • Method and device for acquiring product defect location distribution

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Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] Such as figure 1 As shown, the product defect position distribution acquisition method in the embodiment of the present invention includes the following steps:

[0022] S1, acquire a product image and determine pixel coordinates of defect locations in the product image.

[0023] In one embodiment of the present invention, the product to be inspected for defects can be photographed by an industrial camera to obtain a product image. The embodiment of th...

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Abstract

The present invention provides a method and device for acquiring product defect position distribution, the method comprising the following steps: acquiring a product image and determining the pixel coordinates of the defect position in the product image; mapping the pixel coordinate range of the product image to the latitude and longitude range to obtain the product The longitude and latitude information of the defect position in the image; the longitude and latitude information of the defect position in the product image is converted into a corresponding string through the Geohash algorithm; the defect position distribution in the product image is obtained according to the string. The invention can greatly improve the data processing performance of product defect positions, thereby quickly obtaining the distribution of product defect positions.

Description

technical field [0001] The present invention relates to the technical field of product defect detection, in particular to a method for obtaining product defect position distribution, a product defect position distribution obtaining device, a computer device and a non-transitory computer-readable storage medium. Background technique [0002] In industrial production, it is usually necessary to detect product defects, and record, save and analyze the location distribution of product defects. At present, the commonly used processing method is to calculate the distance between defect points after detecting the defect position and determining the coordinates of defect points, and then analyze the position distribution of product defects based on a large number of distance value data. This processing method has the defects of low efficiency and slow speed, which is particularly obvious in the batch processing of product defect data. Contents of the invention [0003] In order t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06T7/70G01N21/88
CPCG01N21/8851G01N2021/8887G06T7/0004G06T2207/10004G06T2207/30108G06T7/70
Inventor 师文庆韩锦潘正颐
Owner CHANGZHOU MICROINTELLIGENCE CO LTD