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Interferometric Spectroscopy System Based on Band Pass Sampling Technology and Method for Obtaining Target Spectral Information

A band-pass sampling and interference spectroscopy technology, applied in the field of spectral testing, can solve the problems of limited application scenarios, high cost, complex interferometric spectrometer system structure, etc., and achieve the effect of simplifying the system structure, reducing requirements, and reducing performance requirements

Active Publication Date: 2021-11-16
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] Based on the above-mentioned background technology, the present invention proposes an interference spectroscopy system based on bandpass sampling technology and a method for obtaining target spectrum information, which breaks through the Nyquist sampling limitation for interferometric spectrometer interferogram sampling and realizes wide-spectrum and high-resolution for traditional interferometric spectrometers. Provides a solution for rate detection, so as to solve the technical problems of complex structure, high cost and limited application scenarios of the interferometric spectrometer system

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  • Interferometric Spectroscopy System Based on Band Pass Sampling Technology and Method for Obtaining Target Spectral Information
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  • Interferometric Spectroscopy System Based on Band Pass Sampling Technology and Method for Obtaining Target Spectral Information

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Embodiment Construction

[0044] The present invention will be described in detail below in conjunction with specific embodiments and accompanying drawings.

[0045] Such as figure 1 As shown, the present invention proposes a kind of interference spectroscopy system based on band-pass sampling technology, including a pre-optical system 1, an aperture 2 with an aperture below 1mm (which can avoid the aliasing of the pre-dispersed spectrum, and ensure that the subsequent dispersion and parallel The converted spectrum can be arranged in sequence according to the wavelength), the collimating mirror group 3, the dispersion unit 4, the interferometer unit 5, and the photodetector 6.

[0046] The pinhole 2 is located on the output optical path of the front optical system 1, the collimating mirror group 3 is located on the output optical path of the light emitted from the aperture 2, the dispersion unit 4 is located on the output optical path of the collimating mirror group 3, and the interferometer unit 5 is ...

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Abstract

The present invention proposes an interference spectrum system based on bandpass sampling technology and a method for acquiring target spectrum information to solve the technical problems of complex structure, high cost and limited application scenarios of the interference spectrometer system. In the present invention, the broadband spectral signal is subjected to dispersion preprocessing through a dispersion unit to obtain a broadband signal distributed as a wavelength function, and the broadband signal is subjected to interference modulation through an interferometer unit, and then interval sampling is performed according to the bandpass sampling technical requirements, and the photoelectric detector The interferogram information is collected, and the interferogram information collected by the photodetector is equally spaced into interferogram information corresponding to multiple narrowband signals, and then the interferogram information obtained after equal interval division is processed and inverted to obtain the detection target. Corresponding spectral distribution. Compared with the Nyquist sampling technique, the present invention allows sampling at a larger sampling interval, is beneficial to reducing the amount of data, and has great potential for space-borne spectral detection applications.

Description

technical field [0001] The invention relates to the field of spectrum testing, in particular to an interference spectrum system based on bandpass sampling technology and a method for acquiring target spectrum information. Background technique [0002] The interferometric spectrometer is based on the principle of light wave interference. By measuring the interferogram of the target and performing Fourier inverse transformation on the interferogram of the measured target, the spectral information of the target can be obtained. The interferometric spectrometer can indirectly obtain the spectral information of the target, and has the obvious advantages of multi-channel, high throughput, high detection accuracy and low stray light. [0003] The traditional Michelson-type interferometric spectrometer is a time-integrated interferometric spectrometer, which generates an optical path difference through the movement of the moving mirror, and then obtains a complete interferogram thro...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/45
CPCG01J3/45G01J2003/451
Inventor 李思远田飞飞王鹏冲张宏建张周锋
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI