Test systems and charging test system based on charging chip
A technology for testing systems and charging chips, applied in automated testing systems, electronic circuit testing, measuring electricity, etc., can solve the problems of adding lead wires, affecting the accuracy and reliability of lithium charging management chip testing, and changes in voltage and power, etc. problem, to achieve the effect of ensuring the correctness of the test, low cost, and ensuring the reliability of the test
Pending Publication Date: 2020-12-29
AMICRO SEMICON CORP
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Problems solved by technology
The current test schemes generally use real lithium batteries for testing. These test schemes have a shortcoming: after the lithium battery is charged and tested for many times, the voltage and power will change. When the lithium battery is charged to a certain level, It is no longer possible to perform charging detection, and the battery needs to be replaced and checked, which will increase the lead wire failure factors and affect the test accuracy and reliability of the lithium charging management chip.
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[0024] The technical solutions in the embodiments of the present invention will be described in detail below with reference to the drawings in the embodiments of the present invention.
[0025] like figure 1 As shown, Embodiment 1 of the present invention discloses a test system based on a charging chip, the test system includes: a simulated battery circuit and a battery charging current measurement circuit; the simulated battery circuit at least includes a power supply, a power supply port, a floating Ground terminal, signal output terminal and signal input terminal, understandably, in this figure 1 The power supply port, floating ground terminal, signal output terminal, and signal input terminal of the simulated battery circuit not shown in , can be a wire or a solder joint in the actual test circuit, not necessarily a real hardware input and output Interface; the signal input terminal of the analog battery circuit is used to receive the battery voltage signal to be process...
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The invention discloses test systems and a charging test system based on a charging chip. One test system at least comprises an analog battery circuit and a battery charging current measuring circuit,but does not comprise a main controller and a charging measuring chip. The other test system comprises an analog battery circuit, an adjustable battery voltage circuit, a battery charging current measuring circuit and a main controller, but does not comprise a charging measuring chip. The charging test system comprises an analog battery circuit, an adjustable battery voltage circuit, a battery charging current measuring circuit and a main controller. According to the test systems and charging test system based on the charging chip, the influence of the service life of an entity battery does not need to be considered, the test correctness and the test reliability of a charging measuring chip accessed by the test systems are ensured, the test system is simple, the test accessory cost is low, and the application range is wide.
Description
technical field [0001] The invention belongs to the technical field of chip testing, and in particular relates to a charging chip-based testing system and a charging testing system. Background technique [0002] Lithium battery charging management chips generally need to carry out QC (product quality inspection) testing after the final test (testing the packaged chips) before being delivered to customers to ensure that the lithium battery charging management chips are fully tested. The charging indicators meet the application requirements. The current test schemes generally use real lithium batteries for testing. These test schemes have a shortcoming: after the lithium battery is charged and tested for many times, the voltage and power will change. When the lithium battery is charged to a certain level, It is no longer possible to perform charging detection, and the battery needs to be replaced and checked, which will increase the lead wire failure factors and affect the te...
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IPC IPC(8): G01R31/28
CPCG01R31/2834G01R31/2894G01R31/2896
Inventor 黄贤超
Owner AMICRO SEMICON CORP