High-precision baseline estimation method for double-frequency interference imaging altimeter
A technology of interferometric imaging and baseline estimation, which is applied in the field of satellite ocean remote sensing, can solve problems such as unsatisfactory, and achieve the effect of improving the accuracy of the initial value, the accuracy of baseline estimation, and the accuracy of sea surface height measurement
Active Publication Date: 2021-02-02
BEIJING INST OF SPACECRAFT SYST ENG
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This patent only uses signal processing methods for baseline estimation, which cannot meet the baseline estimation requirements of large-width, high-precision imaging altimeters
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[0055] The invention provides a high-precision baseline estimation method for a dual-frequency interferometric imaging altimeter, which forms multiple baselines based on Ku and Ka dual-band interferometric imaging altimetry systems (such as figure 1 As shown), the dual-frequency interferometric imaging altimeter includes a first antenna, a second antenna, a third antenna, and a fourth antenna, wherein the first antenna and the second antenna are installed symmetrically with respect to the satellite body, and are used to send and receive radio frequency signals in the first frequency band , the third antenna and the fourth antenna are symmetrically installed relative to the satellite body, and are used to send and receive radio frequency signals in the second frequency band; the radio frequency signal in the first frequency band is the Ka frequency band signal, covering the outside of the field of view, and the second frequency band is the Ku frequency band signal covering the in...
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The invention relates to a high-precision baseline estimation method for a double-frequency interference imaging altimeter, and the method comprises the steps: taking a baseline length and a baselineinclination angle value measured in real time on a satellite as baseline estimation initial values, and carrying out the high-precision combined estimation of a baseline based on the height information of a reference target and the observation geometry of the interference imaging altimeter. Under the condition of considering that the double-frequency interference imaging altimeter works in the Kafrequency band and the Ku frequency band at the same time, the Ka frequency band and the Ku frequency band also have an observation overlapping region while wide coverage of a scene is realized, and the estimation precision of the on-orbit baseline is further improved by utilizing the fact that the sea surface height value of the overlapping region is fixed. According to the method, the advantagesthat the Ka frequency band is slightly influenced by the ionized layer and the Ku frequency band is slightly influenced by the troposphere (cloud and rain) are exerted, the baseline length estimationprecision is further improved to reach the sub-millimeter level, and the baseline inclination angle precision reaches the sub-arc second level.
Description
technical field [0001] The invention relates to a high-precision baseline estimation method for a dual-frequency interference imaging altimeter, which is suitable for satellite ocean remote sensing and other technical fields. Background technique [0002] Altimeters for measuring sea surface height mainly include pulsar subsatellite altimeter, synthetic aperture subsatellite altimeter, and interferometric imaging altimeter. The pulsar nadir altimeter and the synthetic aperture nadir altimeter are easy to achieve high-precision measurement, but they cannot meet the requirements of wide-range altimetry. The interferometric imaging altimeter extracts the elevation through the interferometric phase, which is easy to realize wide-range measurement and can also ensure high precision. figure 1 A schematic diagram of interferometric altimetry is given, by measuring the phase difference from the phase center of the dual antennas to the observation P After phase unwrapping, the pat...
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IPC IPC(8): G01S7/40
CPCG01S7/40Y02D30/70
Inventor 刘磊张庆君刘杰陆翔王爱明李堃刘红雨边明明肖遥张云华杨杰芳
Owner BEIJING INST OF SPACECRAFT SYST ENG