Method and device for predicting service life of storage device, terminal equipment and storage medium
A storage device, life-span technology, applied in static memory, read-only memory, information storage, etc., can solve the problems of storage devices not being able to make the best use of them, uneven technical levels, unreliable prediction results, etc., to improve the accuracy rate , improve accuracy, improve reliability and the effect of utilization
Pending Publication Date: 2021-02-05
深圳安捷力特新技术有限公司
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However, due to the uneven technical level of manufacturers, the prediction results of this method are not reliable, and it is easy to cause storage devices to be underutilized or overused.
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[0050] In the following description, for the purpose of illustration rather than limitation, specific details such as specific device structures and techniques are presented so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
[0051] The terms used in the following examples are for the purpose of describing particular examples only, and are not intended to limit the application. As used in the specification and appended claims of this application, the singular expressions "a", "an", "said", "above", "the" and "this" are intended to also Expressions such as "one or more" are included unless the context clearly dictat...
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The invention is applicable to the technical field of storage equipment, and provides a method and device for predicting the service life of a storage device, terminal equipment and a storage medium.The method for predicting the service life of the storage device comprises the steps: when it is detected that data processing operation is executed on any data block of the storage device, acquiringattribute parameters of the data processing operation, wherein the data processing operation comprises data writing operation and data erasing operation; calculating the bit error rate and the expected writing / erasing frequency of the data block according to the attribute parameters; if the bit error rate exceeds a first threshold value, or if the bit error rate does not exceed the first thresholdvalue and the expected write / erase frequency exceeds a second threshold value, determining that the memory device reaches the end of life. Whether the service life of the storage device reaches the end point or not is judged by calculating the bit error rate of the data block, the accuracy of predicting the service life of the storage device can be improved, and the utilization rate of the storage device is increased.
Description
technical field [0001] The present application belongs to the technical field of storage devices, and in particular relates to a method, device, terminal device and storage medium for predicting the service life of a storage device. Background technique [0002] Storage devices using non-volatile storage media (Not AND Flash) particles as storage media are widely used in many fields due to their advantages of high speed, strong environmental adaptability and low noise. However, the life of this type of storage device is also limited by the program / erase cycle (P / E cycle) due to the non-volatile storage medium. Once the storage device reaches the end of its life, the data stored in it will will be lost or unavailable, so it is necessary to predict its lifespan in order to migrate or back up data in advance. [0003] At present, storage device manufacturers generally use the write / erase times of non-volatile storage media to indicate the life of storage devices. When the writ...
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IPC IPC(8): G11C16/34G11C16/16
CPCG11C16/3495G11C16/16
Inventor 黄朝松
Owner 深圳安捷力特新技术有限公司