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Method for Determining Parameter Range of Analog Circuit Fault

A technology for simulating circuit faults and determining methods, which is applied in the field of determining the range of fault parameters of analog circuits, and can solve problems such as the difficulty of accurate calculation of closed interval analysis and the difficulty of determining the range of fault parameters

Active Publication Date: 2021-10-22
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

When the circuit structure becomes complex, the analysis of this closed interval will be difficult to calculate accurately, that is, it is difficult to determine the fault parameter range

Method used

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  • Method for Determining Parameter Range of Analog Circuit Fault
  • Method for Determining Parameter Range of Analog Circuit Fault
  • Method for Determining Parameter Range of Analog Circuit Fault

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Embodiment Construction

[0020] DETAILED DESCRIPTION OF THE INVENTION The present invention will be described below in conjunction with the accompanying drawings to be better understood by those skilled in the art. It is important to note that these descriptions will be ignored here when the detailed description of the known function and design may be ignored.

[0021] In order to better illustrate the technical solution of the present invention, the technical idea of ​​the present invention will be briefly described.

[0022] It is assumed that the circuit transport function is h (jω), where j represents the imaginary unit, ω represents the angular frequency, in the case where the test frequency is selected, it is a function of the component parameter, that is, h (x), where x represents the component parameter vector, X = [x 1 , x 2 , ..., x C ], X j A parameter, j = 1, 2, ..., c, and c, represents the number of components of the first element, and the parameter nominal value of the jth element is x. jN ...

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Abstract

The invention discloses a method for determining the fault parameter range of an analog circuit. The component parameter vector is used as an individual of the genetic algorithm population. When the initial population is generated, the parameter value of the faulty component takes a value in the preset fault value range, and the rest The value of the component is within the tolerance range, and the range of the parameter of the faulty component is extracted according to the last generation population after the iteration is completed. In the iterative process of the genetic algorithm, two individual optimization methods can be set, and a specific individual optimization method is adopted according to the number of individuals whose fitness value meets the requirements during individual optimization, so as to improve the iteration effect. The invention realizes accurate determination of the parameter range of the fault element through the genetic algorithm.

Description

Technical field [0001] The present invention belongs to the field of simulation circuit fault diagnosis, and more specifically, involves an analog circuit fault parameter range determination method. Background technique [0002] During the analog circuit operation, component degradation causes performance degradation, timely estimation of component parameters to prevent functional failure. When an analog circuit fails, in addition to the faulty element, the faulty component parameter is the random number in the tolerance range, i.e., all component parameters are variables. The number of simulated integrated circuit measuring points is limited, and the number of independent tests is often smaller than the number of components. Therefore, only the debt equation group can be established by the test amount and component parameters, and the faulty element parameter value cannot be accurately calculated. However, it is possible to obtain a possible fault range according to a circuit st...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/316G06N3/12
CPCG01R31/316G06N3/126
Inventor 杨成林
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA