Tool for quickly generating test description file and application thereof

Abstract

The invention relates to a tool for quickly generating a test description file. The tool comprises a test algorithm module, a design parameter module, a template file module and a test description file generation module, the test algorithm module can import a test algorithm file and provide a test algorithm for the template file to select; the design parameter module can import a design parameterfile; wherein the design parameter file comprises a plurality of rows of design parameters, and each row of design parameters comprises information of a to-be-tested device and parameters of the to-be-tested device in the test chip; according to the tool for formulating the test configuration file, the information of the test configuration item can be checked, and when it is checked that a problemexists, a problem prompt is given.

Description

technical field [0001] The invention relates to the field of integrated circuit wafer testing, in particular to a tool for rapidly generating test description files and its application. Background technique [0002] The integrated circuit manufacturing process is complex and lengthy. It often takes dozens or even hundreds of processes from a semiconductor single wafer to a finished wafer. In the entire manufacturing process, any process step deviation or environmental change will affect the final product performance of the integrated circuit chip. and finished products. Therefore, electrical testing runs through the entire integrated circuit production process and is an important part of chip manufacturing. It is irreplaceable and very effective to control product yield, reliability and production process through the extraction and analysis of effective information from test data. s method. [0003] Wafer Acceptance Test (WAT) is very important in wafer-level chip testing ...

AI Technical Summary

Problems solved by technology

Obviously, in the creation of test plans, the formulation of TestSpec is cumbersome and time-consuming, and once the input conditions change, or when different formats of test plans need to be generated to adapt to different test machines, it needs to be overthrown and redone, and the work efficiency is low.

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