Software defect prediction method based on class imbalance learning algorithm
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HANGZHOU DIANZI UNIV
- Publication Date
- 2021-03-09
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Abstract
Description
technical field
[0001] The present invention is a learning method for class unbalanced data sets, and aims to use this technology to find defect samples in defect data sets, which can help testers locate defects and allocate test resources more effectively, thereby reducing the cost of software testing , specifically relates to a software defect prediction method based on a class imbalance learning algorithm. Background technique
[0002] In the field of software defect prediction, there is a natural class imbalance problem in data sets, that is, in a given data set, the number of instances representing the "defective" class is much less than the number of instances representing the "non-defective" class. However, this defective class is the most important class, and it is the ultimate goal of the classifier to correctly predict samples of the defective class as much as possible. Due to under-representation of defect classes, classification techniques give less weight to in...