Multi-functional vertical zero-position overlapping scanning interferometry device
A technology of scanning interference and measuring devices, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of increased measurement and alignment difficulty caused by deflection mirrors, which is not conducive to ensuring the accuracy and stability of large mirrors, and the optical path is not flexible enough. , to achieve the effect of saving design and manufacturing time and economic cost, improving the range and detection accuracy, and improving detection efficiency
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[0032] The present invention will be further described in detail below with reference to the accompanying drawings.
[0033] like figure 1 As shown, the multifunctional vertical zero-position overlapping scanning interferometric measuring device in this embodiment includes a main control unit 6, a drive control circuit 7 and an air-floating vibration isolation base 8, and the air-floating vibration isolation base 8 is respectively provided with uprights 9 and used for placing DUT (see figure 1 The four-dimensional motion adjustment platform 5 of the reference number 4) in the column 9 is provided with a vertical lifting shaft 91 and the vertical lifting shaft 91 is equipped with a laser wavefront interferometer 2, and the light output path of the laser wavefront interferometer 2 is provided with a removable The CGH five-dimensional motion combined adjustment platform 3 of the holographic CGH component, the CGH five-dimensional motion combined adjustment platform 3 is located ...
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