Method for Estimating Material Reflection Parameters Based on Portable Device Acquisition Images
A portable device, a technology for collecting images, applied in image data processing, image enhancement, image analysis, etc., it can solve the problems of roughness and specular reflection coefficient estimation and the actual value of large deviation, the effect is not robust, etc., to achieve a reasonable mirror surface Reflection and roughness, avoiding artifacts, close to real results
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[0048] This embodiment mainly compares the existing methods (for details, see [Deschaintre, Valentin, et al. "Single-image svbrdf capture with a rendering-aware deep network." ACM Transactions onGraphics (ToG) 37(4), 1-15, 2018 .]) and the estimation results of the method of the present invention in real materials are compared. figure 2 Images of 4 materials captured under ambient light and flash. image 3 For the comparison between the present invention and the existing method, it can be found that the method of the present invention does not have the common artifact phenomenon in the existing method, and the specular map and roughness map estimated by the method are more in line with the objective reality. Figure 4 Compared with the existing method, the image re-rendered by this method is closer to the actual collected image.
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