4 results about "Reflectance factor" patented technology

This invention provides a curvewave domain-based method for removing strong axes based on reflection coefficient attribute volumes, relating to the field of seismic data processing technology. The method includes: performing spectral inversion processing on raw seismic data to generate a reflection coefficient volume; based on the reflection coefficient volume, performing multi-scale, multi-directional layer-by-layer analysis in the curvewave domain, i.e., extracting reflection coefficient curves for each analysis window, determining inflection point locations by calculating the zero point of the second derivative of the curves to identify abrupt changes in the reflection coefficient; simultaneously, constructing local discrete surfaces based on the reflection coefficient volume, identifying local geometric anomaly regions of the reflection coefficient volume by fitting surface patches and calculating Gaussian curvature; and extracting strong reflection coefficient components by combining the determined inflection point locations and the identified local geometric anomaly regions. This invention can achieve precise stripping of strong reflection energy and faithful protection of effective weak signals, improving the reliability of seismic data in identifying and analyzing subsurface lithology and geological structures.

The application discloses a least square reverse-time migration imaging method, device, equipment and medium, and relates to the technical field of geophysical exploration.The application is characterized in that, in the process of capturing the second-order curvature information of a target function at a current iteration point based on the gradient of the target function in the current iteration of a reflection coefficient model, an adjustable weight parameter is used to perform convex combination on a quasi-Newton equation capable of matching the gradient to the target function value in iteration and a quasi-Newton equation directly using an adaptive weight parameter to adjust the reflection system model update amount in iteration, so that the second-order curvature information of the target function at the current iteration point can be captured more accurately at a higher convergence speed, the calculation efficiency is greatly improved by combining the adaptive weight parameter, and finally high-precision migration imaging is performed.

The application provides an image gray estimation method and system, computer equipment and a storage medium, and belongs to the field of image processing, and comprises the following steps: projecting light stripes to a plane where a calibration plate is located, and calibrating plane equations of the light stripes; projecting multiple structure lights to a surface of a measured tubular object, collecting reflected light of the measured tubular object, and extracting light stripe centers; calibrating relative values of surface reflection coefficients of the measured tubular object plane, and obtaining multiple surface reflection coefficient values of the surface of the measured tubular object; taking mean values of the multiple reflection coefficients, and calculating a theoretical gray value of the surface of the measured tubular object according to the mean values of the multiple reflection coefficients. The application can accurately estimate the gray distribution of the surface of the object under specific illumination conditions by using optical simulation, better simulates and optimizes influences of illumination, reflection and other factors on image gray, provides more reliable data support for defect detection of the tubular object, and improves the precision and robustness of the structure light three-dimensional scanning.

The application belongs to the technical field of thermal reflectance coefficient measurement, and discloses a micro-region thermal reflectance coefficient in-situ calibration method and system. The application obtains an offline calibration curve corresponding to a micro-region of a target device, and the offline calibration curve is a function relationship between a temperature-sensitive electrical parameter and a junction temperature; in-situ synchronous measurement is performed on the target device to obtain in-situ measurement information corresponding to the micro-region; the in-situ measurement information includes optical reflectivity signals and temperature-sensitive electrical parameter signals corresponding to at least two different stable temperatures of the micro-region; and the thermal reflectance coefficient of the micro-region is calculated by combining the in-situ measurement information and the offline calibration curve. The application can realize in-situ calibration of the thermal reflectance coefficient in the micro-region.