Method for estimating material reflection parameters based on images acquired by portable equipment
A portable device, reflection parameter technology, applied in image data processing, image enhancement, image analysis, etc., can solve problems such as ineffective effect, large deviation between roughness and specular reflection coefficient estimation and true value, etc., to avoid false effects of shadows, reasonable specularity and roughness
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[0048] This embodiment mainly compares the existing methods (see [Deschaintre, Valentin, et al. "Single-image svbrdf capture with a rendering-aware deep network." ACM Transactions on Graphics (ToG) 37 (4), 1-15, 2018 .]) and the estimation results of the method of the present invention in real materials are compared. figure 2 These are 4 material pictures collected under ambient light and flash light. image 3 For the comparison between the present invention and the existing method, it can be found that the present method does not have the ubiquitous artifact phenomenon in the existing method, and the specular map and roughness map estimated by this method are more in line with the objective reality, from Figure 4 From the rendering results, the image re-rendered by this method is closer to the actual collected image than the existing method.
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