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Method for synchronously diagnosing plasma temperature field through adoption of standard temperature method and relative spectral line method

A technology of plasma and temperature method, which is applied in the field of plasma temperature diagnosis, can solve problems such as inaccurate real-time diagnosis, and achieve the effect of increasing accuracy and widening the temperature range of diagnosis

Active Publication Date: 2021-04-30
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology

[0006] Technical solution of the present invention: Aiming at the deficiencies of the existing technology, a method for synchronously diagnosing the plasma temperature field by the standard temperature method and the relative spectral line method is provided to solve the problem of inaccurate real-time diagnosis of the existing entire arc temperature field. The present invention A new diagnostic method is introduced, which enables the two sets of temperature diagnostic methods, the standard temperature method and the relative spectral line method, to be diagnosed simultaneously and mutually verified, and the temperature field distribution of the entire arc can be accurately obtained

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  • Method for synchronously diagnosing plasma temperature field through adoption of standard temperature method and relative spectral line method
  • Method for synchronously diagnosing plasma temperature field through adoption of standard temperature method and relative spectral line method
  • Method for synchronously diagnosing plasma temperature field through adoption of standard temperature method and relative spectral line method

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Embodiment Construction

[0041] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0042] Such as figure 1 As shown, a kind of standard temperature method of the present invention and relative spectral line method the device used in the method for synchronously diagnosing plasma temperature field comprises two sets of monochromatic optical paths (λ 1 light path and λ 2 light path), CCD camera 10 and spectrometer 17.

[0043] lambda 1 The monochromatic optical path includes the first convex lens 4, the second convex lens 5, the...

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Abstract

The invention discloses a method for synchronously diagnosing a plasma temperature field through adoption of a standard temperature method and a relative spectral line method, and the method comprises the steps: enabling a to-be-detected arc plasma temperature field to be divided into an arc column region temperature part and an arc edge region temperature part; for the arc column region temperature part, finding the relationship between the gray value G of the arc plasma discharge image and the plasma emission coefficient epsilon v, and calculating by using a standard temperature method; and for the arc edge region temperature part, finding out the relationship between the gray value G and the radiation intensity I, and further solving the temperature distribution of the arc edge region by utilizing a relative spectral line method. The arc temperature is diagnosed synchronously through adoption of the standard temperature method and the relative spectral line method, the accuracy of the temperatures of the arc column region and the arc edge region is verified mutually, the accuracy of the whole arc temperature field diagnosis is improved, and the temperature diagnosis range is larger.

Description

technical field [0001] The invention belongs to the field of thermal plasma temperature diagnosis, and in particular relates to a method for synchronously diagnosing the plasma temperature field by a standard temperature method and a relative spectral line method. Background technique [0002] The commonly used temperature diagnosis of arc plasma is mainly divided into probe method and spectral diagnosis method. The experimental equipment used in the probe method is simple and easy to operate. However, due to the characteristics of high temperature, concentrated energy, and high radiation intensity of the plasma arc, the contact probe has a short service life and high consumption, and the contact probe interferes with the diagnosed plasma temperature field distribution, and the spatial resolution is low; in addition , the probe can basically only measure the temperature of a single point, and cannot obtain the temperature distribution of the entire temperature field. The sp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
CPCG01J5/00
Inventor 靳兴月林启富胡立群曾梅花赵鹏
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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