Aerosol optical thickness inversion method without mid-infrared channel sensor

A technology of optical thickness and aerosol, applied in the field of aerosol, can solve the problems of drastic changes in satellite observation attitude and great influence of aerosol optical thickness

Active Publication Date: 2021-05-04
AEROSPACE INFORMATION RES INST CAS +2
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In multi-temporal phases, not only the observation attitude of the satellite changes drastically, but also the solar zenith angle changes due to the phasing running and orbit drift of the satellite, which leads to the influence of the two-way characteristics of the surface in the time window for finding clear days on the aerosol optics. Thickness has a great influence, and the existing technology cannot avoid the influence of the two-way characteristics of the surface on the inversion of aerosol optical depth

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Aerosol optical thickness inversion method without mid-infrared channel sensor
  • Aerosol optical thickness inversion method without mid-infrared channel sensor
  • Aerosol optical thickness inversion method without mid-infrared channel sensor

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0076] Using the image data provided by the NOAA / AVHRR sensor from July 2008 to June 2010 to invert the aerosol optical depth, the specific methods include:

[0077] Step 1: Data Preprocessing

[0078] see figure 2 , the preprocessing method includes: calibration according to the zenith radiance of AVHRR 630nm and 850nm bands, determining the zenith reflectance of AVHRR 630nm and 850nm, judging whether there are clouds, oceans and ice pixels, and if so, removing clouds, oceans and Ice and snow pixel, otherwise use H 2 O and O 3 The column content product is corrected for gas absorption, and when the zenith reflectance of the 630nm band is between (0, 0.25), the residual cloud and cloud shadow pixels are filtered out, specifically including: when the zenith reflectance of the 630nm band is between ( 0, 0.25), remove the highest 50% and lowest 20% of the pixels. Then the time series zenith reflectance data of 630nm and 850nm bands are obtained.

[0079] Step 2: Estimating ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

An aerosol optical thickness inversion method without a mid-infrared channel sensor comprises the following steps: preprocessing a satellite image without a mid-infrared channel sensor in a preset area within a preset time period to obtain processed image data; determining a zenith reflectivity sequence of a red light band and a zenith reflectivity sequence of a near-infrared band of each pixel in the preset time period according to the processed image data; taking the date with the lowest zenith reflectivity ratio of each pixel in the preset time period as a sunny day; removing the background aerosol optical thickness and Rayleigh scattering of the sunny-day image data of each pixel to obtain a sunny-day surface reflectance ratio of each pixel; and determining the inversion day surface reflectance ratio of each pixel according to the sunny-day surface reflectance ratio of each pixel. Based on an aerosol optical thickness inversion algorithm and a lookup table, the aerosol optical thickness of each pixel at a 550nm waveband is determined according to the inversion day surface reflectance ratio of each pixel so that the influence of the bidirectional characteristics of the surface can be effectively reduced, and the inversion accuracy of the aerosol optical thickness is improved.

Description

technical field [0001] The invention relates to the field of aerosols, in particular to an aerosol optical thickness inversion method without a mid-infrared channel sensor. Background technique [0002] The inversion of aerosol optical depth requires accurate estimation of surface albedo information, and an error of 0.01 in the estimation of surface albedo can cause an error of 0.1 in inversion of aerosol optical depth. At present, most methods for estimating surface reflectance can be classified into multi-spectral empirical function methods, multi-temporal image estimation methods, multi-angle image estimation methods, and collaborative inversion methods with aerosol properties, etc. Among them, the most widely used and successful method is the Dark Target method. Based on the premise that there is a certain prior relationship between the surface reflectance of dark targets with dense vegetation in the three channels of red, blue and mid-infrared, this method inverts the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/90G01S7/48G01N21/17G01N21/55
CPCG01S17/90G01S7/4802G01N21/17G01N21/55G01N2021/1793Y02A90/10
Inventor 王颖程天海顾行发余涛郭红师帅一
Owner AEROSPACE INFORMATION RES INST CAS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap