High-resolution imaging system and method
A high-resolution, imaging system technology, applied in the field of microscope imaging, can solve problems such as high cost, light loss energy, and system complexity, and achieve low cost, simple system, and improved imaging effects
Inactive Publication Date: 2021-05-04
广东粤港澳大湾区黄埔材料研究院
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However, in the process of aberration correction and compensation, the optical path will be introduced into the aberration correction device, which will lead to loss of light energy, and the system is complex and costly
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[0031] The present invention will be further described below in conjunction with drawings and embodiments.
[0032] see figure 1 , a high-resolution imaging system, comprising: an objective lens 102, a STORM imaging unit, and an aberration detection unit; the aberration detection unit includes a first spectroscopic flat glass 103 and an aberration detector 106; the objective lens 102 is arranged on a sample to be imaged 101 Directly below, the imaging unit is set directly below the objective lens 102, the first spectroscopic flat glass 103 is disposed between the objective lens 102 and the imaging unit, and is obliquely disposed directly below the objective lens 102, and the aberration detector 106 is horizontally located on the first spectroscopic flat glass 103 one side of the reflective surface.
[0033] In this embodiment, the STORM imaging unit includes: a tube mirror 104, a second spectroscopic flat glass 105, and an imaging camera 107; the tube mirror 104 is located at...
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The invention discloses a high-resolution imaging system and method. The system comprises an objective lens, an STORM imaging unit and an aberration detection unit. The aberration detection unit comprises first light splitting plate glass and an aberration detector; and the objective lens is arranged under a sample to be imaged, the imaging unit is arranged under the objective lens, the first light splitting plate glass is arranged between the objective lens and the imaging unit and obliquely arranged under the objective lens, and the aberration detector is horizontally located on one side of a reflecting surface of the first light splitting plate glass. The system only has an aberration detection part and does not have an aberration correction part. The requirement for improving the imaging effect can be met by measuring the inherent aberration of the sample. Only one aberration detector is used for off-line detection of aberration introduced by the sample so as to correct the imaging picture, the mode does not cause light energy losses, and the system is simple and low in cost.
Description
technical field [0001] The invention relates to the technical field of microscope imaging, in particular to a high-resolution imaging system and method. Background technique [0002] In the system of TIRF illuminating the sample and STORM microscope super-resolution imaging of the sample, TIRF illumination belongs to total reflection and generates evanescent waves, that is, the light will be internally reflected in the optically dense medium during total reflection. According to the part of physical optics, the light will be in the A thin layer of evanescent waves is generated in an optically sparse medium. Under typical effective illumination, the penetration is only 50nm to 100nm, and only the fluorescent molecules near the surface of the cover glass (into the field) can be excited, and the far-field molecules are not excited. During TIRF illumination, when the evanescent wave irradiates the sample, the fluorescent substance on the sample emits fluorescence, and the fluor...
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IPC IPC(8): G02B21/18G02B21/02G02B21/36G02B21/34G02B21/16
CPCG02B21/18G02B21/02G02B21/361G02B21/34G02B21/365G02B21/16
Inventor 杨乐宝王宏达
Owner 广东粤港澳大湾区黄埔材料研究院