Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Infrared band chemical laser linewidth measuring device and measuring method

A chemical laser and infrared band technology, applied in the field of spectral measurement, can solve the problems of high stability of laser power and achieve low cost, simple method and high precision

Active Publication Date: 2022-07-12
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method requires high power stability of the laser, and requires a long-distance delay fiber in the measurement optical path, and an optical power amplifier in the loop self-heterodyne. and mid-wave infrared chemical lasers, it is difficult to make practical measurements of linewidth using this method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Infrared band chemical laser linewidth measuring device and measuring method
  • Infrared band chemical laser linewidth measuring device and measuring method
  • Infrared band chemical laser linewidth measuring device and measuring method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, and the protection scope of the present invention can be more clearly defined.

[0028] see figure 1 , the embodiments of the present invention include:

[0029] An infrared band chemical laser linewidth measuring device mainly includes a chemical laser 1, a narrow linewidth laser 9, and a data acquisition card 6. A first beam splitter is sequentially connected between the narrow linewidth laser 9 and the chemical laser 1. 10. Beam combiner 2. The laser beams output by the chemical laser 1 and the narrow linewidth laser 9 are combined, and then input to the data acquisition card 6 after passing through the fast response detector 3, the radio frequency filter 4, and the power detector 5 in turn; The laser passes through the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
widthaaaaaaaaaa
Login to View More

Abstract

The invention discloses an infrared band chemical laser line width measuring device, which mainly includes a chemical laser, a narrow line width laser and a data acquisition card; the chemical laser and the laser output from the narrow line width laser are combined, and then undergo fast response detection in turn. The narrow linewidth laser reflected by the narrow linewidth laser passes through the optical multi-pass absorption cell and the photodetector, and the signal output by the photodetector is input to the data acquisition card; so The narrow-line-width laser reflected by the narrow-line-width laser is also input into the wavelength meter through the reflecting mirror in turn, and the output data of the wavelength meter is input into the data acquisition card. Also disclosed is a method for measuring the linewidth of a chemical laser in an infrared band. The invention has high measurement accuracy and simple testing process, and provides an effective method for engineering application to realize accurate and rapid measurement of the linewidth of the chemical laser in the infrared band.

Description

technical field [0001] The invention relates to the technical field of spectral measurement, in particular to a device and method for realizing precise measurement of the linewidth of chemical lasers in the infrared band based on laser heterodyne technology. Background technique [0002] Infrared band chemical lasers have the advantages of short wavelength, high output power and good beam quality, and play an important role in the field of optoelectronic engineering. The linewidth of the laser is one of the important factors affecting the laser atmospheric transmission efficiency, which has a decisive influence on the final transmission efficiency evaluation. [0003] At present, there are two commonly used measurement methods for laser linewidth: spectrometer measurement method and Selfie frequency method. When the laser linewidth is less than 300MHz, the traditional measurement methods based on grating spectrometers or Fourier transform spectrometers have been difficult t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J11/00G01M11/02
CPCG01J11/00G01M11/0271
Inventor 卢兴吉曹振松朱文越黄印博刘强黄宏华王英俭
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com