Projector corresponding point high-precision matching method based on polar line sampling and application thereof

Abstract

The invention discloses a projector corresponding point high-precision matching method based on polar line sampling and application thereof. The method comprises the following steps of pre-calibrating internal and external parameters and distortion models of a structured light composition camera and a projector, in the corresponding point matching process, conducting sampling and fitting on a projector polar line deformed due to distortion according to any one camera pixel point subjected to distortion removal and a measured phase value of the camera pixel point, and acquiring a bent polar line equation corresponding to the projector polar line on the imaging surface of the projector, and constructing an equiphase line on the imaging surface of the projector by using the measured phase value, calculating the intersection point of the equiphase line and the bent polar line, and finally obtaining high-precision projector distortion pixel points corresponding to the camera pixel points. The method can be used for high-precision three-dimensional reconstruction or system calibration of the structured light contourgraph.

Description

technical field [0001] The invention belongs to the technical field of phase measurement contours, and more particularly relates to a high-precision matching method for corresponding points of a projector based on epipolar sampling and its application. Background technique [0002] A fringe projection structured light profiler or a phase measurement profiler is mainly composed of a computer, a camera and a projector. Due to factors such as the manufacturing process and assembly error of the lens, the actual pixel points of the camera or projector on its imaging plane often do not coincide with the ideal pixel points under the pinhole imaging model. The difference between the actual image point and the ideal image point is distortion error. Distortion errors cause systematic errors in 3D surface reconstruction based on optical triangulation. [0003] Due to the asymmetrical arrangement of the projection device relative to the optical axis, the distortion of the projector is...

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Problems solved by technology

[0005] Aiming at at least one defect or improvement requirement of the prior art, the present invention provides a high-precision matching method for corresponding points of a projector based on epipolar sampling and its application, the purpose of which is to solve the problem of high-precision structured light profilers or phase measurement profilers. Technical problems of system calibration or offline measurement

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