Temperature test device and method capable of realizing rapid temperature change

Abstract

The invention relates to a temperature test device and method capable of achieving rapid temperature change, and the device comprises a high-temperature gas source, a test bin, a plurality of gas inlet pipes which are connected with the high-temperature gas source and the test bin, a plurality of exhaust pipes which are connected to the test bin, and a temperature maintaining device which is disposed in the test bin. The temperature maintaining device comprises a heater and a refrigerator or only comprises the heater, each air inlet pipe is provided with a high-speed air inlet switch valve, each air outlet pipe is provided with a high-speed air outlet switch valve, and the high-temperature air source is used for providing high-temperature and high-pressure air. The temperature test device is simple in structure, convenient to use and capable of rapidly achieving rapid change of the temperature in the test bin and shortening the temperature change time, meanwhile, the temperature of each stage can be flexibly adjusted according to needs, a steady and constant-pressure environment in the test bin can be maintained, and therefore the accuracy of a product sample temperature test is guaranteed.

Description

technical field [0001] The invention relates to the field of product temperature shock tests, in particular to a temperature test device and method capable of realizing rapid temperature changes. Background technique [0002] In many test occasions, it is necessary to conduct a temperature shock test on the sample. For the negative temperature of the first section, a high and low temperature test chamber is often used (the first section is refrigeration, and the second section is heating), and for the two sections of positive temperature, the Segmented control is often used (both stages are heating), the ideal temperature shock curve should be a step change from the first stage temperature to the second stage temperature, but in practice, from the first stage temperature to the second stage temperature The temperature of the section generally needs tens of minutes of transition time, and the temperature change is relatively slow. At present, tests that require a short trans...

AI Technical Summary

Problems solved by technology

At present, tests that require a short transition time or even a step change are often implemented by quickly replacing the test chamber, that is, the sample is quickly moved from one sample environment to another high-temperature environment, but the replacement process is the fastest. It also takes 5 to 10 seconds. At the same time, the test environment, such as the pressure test, needs to go through the process of pressure relief---boosting, which leads to too long transition time, which is not conducive to the temperature shock test of the test.

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