Comprehensive test equipment for discrete device series

Abstract

The invention relates to the technical field of test equipment, and discloses comprehensive test equipment for a discrete device series. The comprehensive test equipment comprises an upper box body, wherein two lower box bodies are fixedly installed at the bottom part of the upper box body, push rod motors are fixedly installed on the inner walls of the tops of the lower box bodies, telescopic rods are fixedly installed on output shafts of the push rod motors, a connecting plate is fixedly installed at the top part of each telescopic rod, connecting holes are formed in each connecting plate, connecting rods are slidably installed in the two connecting holes, and the bottom ends of the two connecting rods extend to the position below each connecting plate and are fixedly provided with first pressing plates. The comprehensive test equipment is simple in structure and convenient to operate, discrete devices can be quickly and conveniently fixed and clamped, sliding is prevented when the discrete devices are tested, the effect of testing the discrete devices is improved, and therefore the requirements of people are met.

Description

technical field [0001] The invention relates to the technical field of testing equipment, in particular to a series of comprehensive testing equipment for discrete devices. Background technique [0002] An integrated circuit is a tiny electronic device or component. Using a certain process, the transistors, diodes, resistors, capacitors, inductors and other components required in a circuit are interconnected together, fabricated on a small or several small semiconductor wafers or dielectric substrates, and then packaged in a tube. Inside the shell, it becomes a microstructure with the required circuit functions; integrated circuit boards can be divided into two categories: analog integrated circuit boards and digital according to their functions and structures. According to the manufacturing process, they can be divided into semiconductors and thin films. According to the level of integration, it can be divided into small-scale, medium-scale, large-scale and ultra-large-sca...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problem that the prior art does not have the function of fixing and clamping the discrete device, so it is easy to cause the discrete device to slip during the test, which affects the accuracy of the discrete device test, so it cannot satisfy people. The issue of the need for a comprehensive test facility for the proposed family of discrete devices

Images