Rapid analysis method for local change electromagnetic scattering problem based on grid modification and IEDG

Abstract

The invention discloses a rapid analysis method for a local change electromagnetic scattering problem based on grid modification and IEDG, and the method comprises the steps: firstly calculating an impedance matrix of a parent structure, then completing the edge of the structure through the grid modification, enabling a sawtooth-shaped boundary to become smooth, and subsequently adding a structure; introducing IEDG processing, and solving the problem of mismatching of nodes of the added structure and a residual structure at a boundary. According to the method, only one-time modeling subdivision can be carried out and only one-time calculation of the impedance matrix and the inverse matrix of the original target is carried out under the condition that the target is subjected to multiple times of local changes, so that the calculation complexity is reduced, the calculation efficiency is improved, the grid error is reduced, and a changed parent structure is properly connected with the subsequent added structure; whether the grids are conformal or not is not considered, the flexibility of a traditional local change algorithm is improved, and the application range is expanded.

Description

technical field [0001] The present invention relates to a method for analyzing the electromagnetic scattering characteristics of a target, in particular to a grid discrete target that undergoes local changes in the program and requires a grid modification algorithm and a discontinuous Galerian method to deal with grid errors and grid errors after the change. A fast analysis method for mismatched electromagnetic scattering. Background technique [0002] The analysis of the electromagnetic scattering characteristics of electrically large targets has always been a hot spot of concern by scholars at home and abroad, especially the electromagnetic scattering problem of locally changing electrically large targets. In actual electromagnetic engineering problems, it is often necessary to make multiple local modifications to the model in order to find optimal structure. For example, in order to reduce the radar cross section (RCS) of the target or to obtain better performance parame...

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Problems solved by technology

However, they all solve the situation where the changing structure and the parent structure are independent and separated from each other or the mesh matching is conformal. Since there will be a large mesh error when the subtraction structure and the parent structure are connected, they cannot It handles the situation where a structure is subtracted from the parent grid itself when the target has been grid-discrete, and it cannot handle the situation where the local change position is randomly set in the program, because the current continuity cannot be guaranteed when the boundary grid does not match, It also cannot handle the case where the contact boundary mesh of the added structure and the parent structure does not match

When the subtracted structure is on the surface of the parent structure, jagged edges will appear at the boundary of the remaining structure after the change, resulting in mesh errors that are not completely consistent with the expected target structure, which also affects the subsequent local changes.

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