A driver test system based on baby-lin-rm-ii
A technology of baby-lin-rm-ii and test system, applied in the direction of test/monitoring control system, general control system, control/regulation system, etc., can solve communication address confusion, drive failure, increase test equipment cost, etc. problem, to achieve the effect of improving test efficiency, avoiding node address conflicts, and increasing the number
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[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0027] Aiming at the problem that the test control equipment disclosed in the prior art is difficult to meet the test requirements, this application discloses a driver test system based on Baby-LIN-RM-II, see figure 1 , the test system can include:
[0028] Baby-LIN-RM-II controller (controller for short) 100 and power module 200, wherein, the X6-1 interface in the view is the grounding interface of the LIN module, the X6-2 interface is the LIN s...
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