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A driver test system based on baby-lin-rm-ii

A technology of baby-lin-rm-ii and test system, applied in the direction of test/monitoring control system, general control system, control/regulation system, etc., can solve communication address confusion, drive failure, increase test equipment cost, etc. problem, to achieve the effect of improving test efficiency, avoiding node address conflicts, and increasing the number

Active Publication Date: 2022-03-22
麦格纳汽车外饰系统(上海)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] In addition, too many drives connected in parallel will cause communication address confusion, resulting in the drive not working properly
[0012] In summary, multiple test control equipment or imported control equipment are required to meet the demand for 12 test samples, which will greatly increase the cost of test equipment

Method used

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  • A driver test system based on baby-lin-rm-ii
  • A driver test system based on baby-lin-rm-ii

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Embodiment Construction

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0027] Aiming at the problem that the test control equipment disclosed in the prior art is difficult to meet the test requirements, this application discloses a driver test system based on Baby-LIN-RM-II, see figure 1 , the test system can include:

[0028] Baby-LIN-RM-II controller (controller for short) 100 and power module 200, wherein, the X6-1 interface in the view is the grounding interface of the LIN module, the X6-2 interface is the LIN s...

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PUM

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Abstract

The present invention provides a driver testing system based on Baby-LIN-RM-II. The system forms a low eight-bit address A1 by connecting the DNN3 pin of a part of the driver with the ground wire, and the DNN3 pin of the other part of the driver is connected with the power line. The high eight-bit address A2 is formed, and the node address conflict can be avoided through two types of addresses, the low-order address A1 and the high-order address A2, which prevents the problem of insufficient addresses caused by too many test drives, and improves the ability of the system to simultaneously test drives. Quantity, improve the test efficiency.

Description

technical field [0001] The invention relates to the technical field of test systems, in particular to a driver test system based on Baby-LIN-RM-II. Background technique [0002] AGS (Active Grille Shutter) is an air intake grill adjustment system. By changing the opening and closing angle of the air intake grille, the intake air volume of the engine compartment and the wind resistance of the vehicle can be controlled, so as to improve the fuel economy of the vehicle and accelerate the engine warm-up process and other functions. [0003] Baby-LIN-RM-II is a LIN bus controller, which can be used for LIN bus simulation, ECU test, automatic test system, secondary development, etc. It can be used by connecting to a computer via USB; or running independently offline. It is used to simulate LIN bus master node and slave node, and can simulate multiple slave nodes at the same time. The operations to be executed (such as running or stopping, sending another message, changing a cert...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B23/02G01R31/00
CPCG05B23/0213G01R31/00G05B2219/24065
Inventor 霍腾飞吴诚刚李显
Owner 麦格纳汽车外饰系统(上海)有限公司