Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Data test method and device, server and storage medium

A data testing and server technology, which is applied in the field of cloud deployment, can solve problems such as insufficient hardware resources, hardware resource bottlenecks, and difficulty in expanding the hardware resources of the test system, so as to improve hardware resource bottlenecks, improve fluency, and solve hardware resource shortages. Effect

Pending Publication Date: 2021-09-07
PINGAN PUHUI ENTERPRISE MANAGEMENT CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the field of credit insurance automation testing, since the credit insurance test system belongs to the local environment, the test server is deployed locally instead of on the cloud, which makes it difficult to expand the hardware resources of the test system and easily encounter hardware resource bottlenecks. There is a problem of multiple concurrency, and it is easy to have a stuck problem during the test

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Data test method and device, server and storage medium
  • Data test method and device, server and storage medium
  • Data test method and device, server and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0027] The flow charts shown in the drawings are just illustrations, and do not necessarily include all contents and operations / steps, nor must they be performed in the order described. For example, some operations / steps can be decomposed, combined or partly combined, so the actual order of execution may be changed according to the actual situation. In addition, although the functional modules are divided in the schematic diagram of the device, in some cases, they ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to cloud deployment, and provides a data test method and device, a server and a storage medium, and the method comprises the steps: generating a target message queue according to message bodies of a plurality of test request messages sent by a Web server; performing keyword extraction on the plurality of message bodies in the target message queue to obtain a plurality of pieces of keyword information; determining a test host allocated for each test request message according to the multiple pieces of keyword information; and distributing each test request message to the respective distributed test host, so that each test host executes a test task according to the respective received test request message, and returns test data obtained by executing the test task to the Web server. The invention also relates to artificial intelligence, and aims to improve the fluency of data testing.

Description

technical field [0001] The present application relates to the technical field of cloud deployment, and in particular to a data testing method, device, server and storage medium. Background technique [0002] With the development of the Internet and the software industry, the test requirements for server performance and stability are becoming more and more important. Therefore, it is necessary to conduct tests in the process of server selection to determine whether the selected server meets business needs. the process of. In the field of credit insurance automation testing, since the credit insurance test system belongs to the local environment, the test server is deployed locally instead of on the cloud, which makes it difficult to expand the hardware resources of the test system and easily encounter hardware resource bottlenecks. Due to the problem of multiple concurrency, it is easy to have a stuck problem during the test. Therefore, how to improve the fluency of data te...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F11/34G06F16/2455
CPCG06F11/3688G06F11/3409G06F16/24552
Inventor 陈招泽
Owner PINGAN PUHUI ENTERPRISE MANAGEMENT CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com