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Omni directional automatic appearance detection device for capacitors

A technology of appearance inspection and capacitors, which is applied in the field of all-round automatic appearance inspection devices, can solve the problems of inspectors' fatigue, low inspection efficiency, and false inspections, so as to improve inspection efficiency and quality, avoid false inspections or missed inspections, and improve inspection efficiency. Give way reliable effect

Active Publication Date: 2021-09-17
JIANGSU FALA ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the current capacitor production process, the appearance inspection of capacitors is mainly done manually. The whole inspection process has a single work content, low inspection efficiency, and inspection personnel are prone to fatigue, resulting in wrong or missed inspections, which seriously affects the inspection quality of capacitors.

Method used

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  • Omni directional automatic appearance detection device for capacitors
  • Omni directional automatic appearance detection device for capacitors

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Embodiment Construction

[0015] In order to deepen the understanding of the present invention, the present invention will be described in further detail below in conjunction with the examples and accompanying drawings. The examples are only used to explain the present invention and do not constitute a limitation to the protection scope of the present invention.

[0016] Such as figure 1 with figure 2 As shown, an all-round automatic appearance inspection device for capacitors includes a detection belt 1, a shell size detector 2, a pin size detector 3 and a controller, and the detection belt 1 is connected to a conveyor belt 4, and the conveyor belt 4 There are several capacitors 41 to be checked, and the connection between the detection belt 1 and the conveyor belt 4 is provided with two high-speed rotating rollers 11 symmetrically distributed front and back on the detection belt 1, the shell size detector 2 and the pin size detector 3 are sequentially distributed on the detection belt 1. The shell ...

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Abstract

The invention discloses an omni directional automatic appearance detection device for capacitors. The device comprises an inspection band, a shell size detector, a pin size detector and a controller, wherein the inspection band is connected with a conveyor belt, a plurality of capacitors to be detected are arranged on the conveyor belt, and two high-speed rotating rollers symmetrically distributed on the inspection band front and back are arranged at the joint of the inspection band and the conveyor belt. According to the automatic appearance detection device, intermittent feeding of the capacitors to be detected is achieved through the high-speed rotating rollers on the inspection band, the feeding mode can be reliable, the structure is simple, meanwhile, automatic detection of the appearance of finished capacitor products is achieved through the shell size detector and the pin size detector, manual detection is replaced, the phenomenon of wrong detection or missing detection is avoided, and the detection efficiency and quality are improved.

Description

technical field [0001] The invention belongs to the field of capacitor appearance detection equipment, and in particular relates to an all-round automatic appearance detection device for capacitors. Background technique [0002] A capacitor is a device that holds charges. It is composed of two conductors close to each other with a layer of non-conductive insulating medium in the middle. It is one of the electronic components widely used in electronic equipment and is widely used in circuits. , coupling, bypass, filtering, tuning loop, energy conversion, control, etc. In the current capacitor production process, the appearance inspection of capacitors is mainly done manually. The whole inspection process has a single work content, low inspection efficiency, and inspection personnel are prone to fatigue, resulting in wrong or missed inspections, which seriously affects the inspection quality of capacitors. Contents of the invention [0003] The object of the present inventi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/344B07C5/10B07C5/36B07C5/02
CPCB07C5/344B07C5/10B07C5/362B07C5/02B07C2301/0008
Inventor 夏杰
Owner JIANGSU FALA ELECTRONICS