Anti-shake test method, device and electronic equipment

Abstract

The invention relates to the technical field of image processing, in particular to an anti-shake test method, a device and electronic equipment.The method comprises the steps of collecting at least two test videos, wherein the test videos are collected under at least two sets of preset shake parameters and subjected to anti-shake processing; performing image analysis on preset regions in the at least two test videos, and determining a jitter result; and determining a target jitter parameter based on the jitter result. The target jitter parameter can be determined by acquiring the test videos after anti-jitter processing under the at least two groups of preset jitter parameters, performing image analysis on the test videos, determining the jitter result of each test video, and performing comparative analysis on the jitter results to determine a target jitter result. The test process is carried out based on the real jitter scene and fits the actual application. The determined target jitter parameter also has high reliability, and the method is simple and easy to implement.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to an anti-shake test method, device and electronic equipment. Background technique [0002] Because the shooting of videos is not necessarily all shot in static scenes, it may also be shot in moving scenes, and the videos shot in moving scenes will have jitters. Based on this, in order to ensure that the captured video is as stable and clear as possible, it is necessary to have an anti-shake algorithm built into the image acquisition device to eliminate shaking. [0003] Currently commonly used anti-shake algorithms are mainly divided into two categories, namely optical anti-shake and electronic anti-shake. Taking electronic anti-shake based on gyroscope as an example, the core idea of ​​the electronic anti-shake algorithm is to perform affine transformation on the image, and the affine transformation is related to the setting of shaking parameters in the anti-shake algor...

AI Technical Summary

Problems solved by technology

[0005] In view of this, the embodiment of the present invention provides an anti-shake test method, device and electronic equipment to solve the problem of how to accurately determine the jitter parameters

Images