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Concurrent activity graph test scene generation method and system based on critical degree division

A technology for testing scenarios and activity diagrams, applied in software testing/debugging, error detection/correction, instrumentation, etc., can solve problems such as path explosion of concurrent activity diagrams, and achieve high coverage

Pending Publication Date: 2021-09-28
XI AN JIAOTONG UNIV
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Problems solved by technology

[0005] In order to solve the problems existing in the prior art, the object of the present invention is to provide a concurrent activity diagram test scenario generation method and system based on criticality division, and the present invention can solve the problem of path explosion of concurrent activity diagrams

Method used

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  • Concurrent activity graph test scene generation method and system based on critical degree division
  • Concurrent activity graph test scene generation method and system based on critical degree division
  • Concurrent activity graph test scene generation method and system based on critical degree division

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Embodiment

[0084] refer to figure 1 , the present embodiment is based on the concurrent activity diagram test scenario generation method of criticality division, comprising the following steps:

[0085] S1, activity diagram modeling

[0086] Analyze the project system, use the yEd drawing tool to model the modules containing the concurrent structure in the project, and obtain the corresponding concurrent activity diagram.

[0087] refer to figure 2 with image 3 , the specific method of this step is as follows:

[0088] S101. First, model the modules containing the concurrent structure according to project requirements to obtain a concurrent activity diagram, and then replace the nested concurrent structure, loop structure, and branch structure in the concurrent activity diagram with composite nodes. Such as figure 2 In the branch structure and nested concurrent structure, we can use compound nodes X, Y, Z instead, such as image 3 shown.

[0089] S2, export as xml file

[0090...

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Abstract

The invention discloses a concurrent activity graph test scene generation method and system based on critical degree division. The method comprises the following steps: carrying out the modeling of a module containing a concurrent structure in a project, and obtaining a concurrent activity graph corresponding to the module containing the concurrent structure; converting the concurrent activity graph into an xml file; analyzing the xml file to obtain an adjacent matrix of the quantized directed graph; performing key degree division on nodes corresponding to the activity graph according to the adjacency matrix to obtain a node set with a hierarchical relationship; and inputting the node set into a KeyPermute algorithm to obtain a concurrent activity graph test scene. According to the method, under the condition that the coverage rate is met, the problem of test scene path explosion is avoided, and meanwhile the problem that concurrent modules are difficult to process is solved.

Description

technical field [0001] The invention belongs to the technical field of software testing, and in particular relates to a method and a system for generating concurrent activity graph test scenarios based on criticality division. Background technique [0002] Software testing plays an increasingly important role in the software development process. How to design an efficient test case set and how to improve user experience are issues that every tester should consider. But at present, most of the testing work is manually writing test cases, the whole process takes a long time, and the obtained test cases may not be optimal. Therefore, the automatic generation of test cases can not only reduce the time consumption of testers in the test process, but also ensure a certain test coverage. But most of the current research is based on code testing. In this case, testing can only be done after the code is completed, so it will consume time and may perform regression testing many time...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3684
Inventor 杜小智张金金张博文常宸瑞
Owner XI AN JIAOTONG UNIV
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