Test process configuration method and device, storage medium and equipment

Abstract

The invention relates to a test process configuration method and device, a storage medium and equipment, the test process is a test process different from a main test process in a semiconductor product test, and the test process configuration method comprises the following steps: determining at least one test item of a semiconductor product; obtaining a first test template corresponding to the test item, wherein the first test template comprises preset test parameters; displaying the preset test parameters; receiving test parameters adjusted according to the preset test parameters; configuring a current test parameter of the test item according to the adjusted test parameter; and forming a test flow of the semiconductor product according to the current test parameters of the test item. According to the technical scheme provided by the embodiment of the invention, the related preset test parameters can be automatically called according to the test items input by the user, the user operation is reduced, the mistaken input frequency is reduced, and the efficiency is high.

Description

technical field [0001] The present disclosure relates to the technical field of semiconductors, and in particular to a configuration method, device, storage medium and equipment of a testing process. Background technique [0002] Wafer testing is a critical process after wafer fabrication. In order to analyze product characteristics, reliability and improve product yield, users will do a series of engineering experiments to verify, and the engineering experiment process often involves operations of adding, modifying, and deleting. [0003] At present, when users create a new experiment process, they need to manually establish the experiment process according to the product, download the template, enter the data in the relevant fields of the site, and import it into the system. This will consume a lot of data and complicated operations, which will consume more time and reduce work efficiency. In addition, there are certain logic rules in each field, and there is a risk of in...

AI Technical Summary

Problems solved by technology

[0003] At present, when users create a new experimental process, they need to manually establish the experimental process according to the product, download the template, enter the data in the relevant fields of the site, and import it into the system. This will consume a lot of data and complicated operations, which will consume more time and reduce work efficiency.

In addition, there are certain logic rules in each field, and there is a risk of input errors or omissions when manually entering data, and the established process parameter settings may affect the test results; moreover, if the relevant information is incorrectly modified, it may directly lead to failure during the test. Running and using, affecting the progress of the experiment

[0004] With more and more products, there are more experimental procedures, and the amount of data increases dramatically. When users manually set the procedures, they need to manually check whether they already exist. If the serial numbers are repeated, the import system will fail, increasing the complexity of the operation. low efficiency

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