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Multi-axis platform driving method of high-precision scanning tunneling microscope

A driving method and high-precision technology, applied in the field of programmable chips and multi-axis platform drives, which can solve problems such as large driving errors, high machining requirements, and the inability of single-axis systems to meet requirements

Pending Publication Date: 2021-11-26
XIAMEN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

By establishing open-loop hysteresis models such as Bouc-Wen, Preisach, and Duhem [4-6], directly changing the input signal to compensate for hysteresis characteristics can obtain a faster motion rate, but cannot track errors; Closed-loop methods such as integral differential control, adaptive control, fuzzy control, sliding mode control, and neural network control [7-9] can monitor the output in real time and adjust dynamically to achieve high precision, but the speed of motion is limited
[0004] With the development of multi-axis technology, single-axis systems can no longer meet the needs
More time-varying, nonlinear, and uncertain physical quantities will be introduced into the control system, and they often affect each other, which will cause the problem of multi-axis cross-coupling
People often use piezoelectric ceramics and transmission mechanisms to achieve multi-dimensional parallel motion. However, it is difficult to ensure the accuracy of multi-axis synchronous tracking trajectory using a single-axis control strategy.
Existing multi-axis platforms often adopt the transmission structure of flexible hinges, which have the advantages of compact structure, high resolution, no friction and no gap, etc., but their light damping characteristics will cause system vibration [10], and high-speed inter-axis motion will cause Large drive error, which restricts the motion accuracy of the system
In practical applications, this structure requires higher machining requirements and increases a lot of cost, and it is impossible to realize the multi-axis platform drive of low-cost and high-precision scanning tunneling microscope

Method used

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  • Multi-axis platform driving method of high-precision scanning tunneling microscope
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[0059] The present disclosure will be further described in detail below with reference to the drawings and embodiments. It can be understood that the specific implementation manners described here are only used to explain relevant content, rather than to limit the present disclosure. It should also be noted that, for ease of description, only parts related to the present disclosure are shown in the drawings.

[0060] It should be noted that, in the case of no conflict, the implementation modes and the features in the implementation modes in the present disclosure can be combined with each other. The technical solutions of the present disclosure will be described in detail below with reference to the accompanying drawings and in combination with implementation manners.

[0061] Unless otherwise specified, the illustrated exemplary embodiments / embodiments are to be understood as exemplary features providing various details of some manner in which the technical idea of ​​the pre...

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Abstract

The invention provides a multi-axis platform driving method of a high-precision scanning tunneling microscope. The multi-axis platform driving method comprises the following steps: acquiring a plurality of displacement set quantities; obtaining n single-axis model controllers; obtaining a micro-motion platform object; acquiring a displacement compensator; obtaining a decoupling controller; and acquiring a displacement output quantity. The invention further provides a method for establishing the single-axis model and a programmable chip.

Description

technical field [0001] The disclosure relates to the technical field of precision testing instruments, and in particular to a method for establishing a single-axis model, a multi-axis platform driving method for a high-precision scanning tunneling microscope, and a programmable chip. Background technique [0002] Scanning Tunneling Microscope (STM) is an instrument that can obtain nanoscale topographic features of the sample surface in real time, and is widely used in chemical, biomedical, integrated chip processing and other fields [1-3]. As an integral part of the multi-axis platform, it often plays a key role. It determines the accuracy of the system, and a small error will cause the deformity of the scanning trajectory. Because piezoelectric ceramics have the advantages of low cost, compact structure, high frequency, and powerful output, existing multi-axis platforms often use piezoelectric ceramics as drivers. However, their own nonlinear characteristics such as hystere...

Claims

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Application Information

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IPC IPC(8): G06F30/20
CPCG06F30/20
Inventor 范贤光支瑜亮任斌
Owner XIAMEN UNIV
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