Deep ultraviolet LED chip and manufacturing method thereof
A technology of LED chips and manufacturing methods, which are applied in the directions of electrical components, circuits, semiconductor devices, etc., to achieve the effects of reducing the probability of total reflection, improving light extraction efficiency, and reducing steady-state voltage
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Embodiment 1
[0030] This embodiment provides a deep ultraviolet LED chip, such as figure 1 is a cross-sectional view of the growth substrate and the epitaxial layer in the deep ultraviolet LED chip, figure 2 is a cross-sectional view of a deep ultraviolet LED chip, image 3 It is a top view of a deep ultraviolet LED chip, including: a growth substrate and an epitaxial layer formed on the growth substrate, and the epitaxial layer includes an N-type semiconductor layer, a barrier layer 4, a light-emitting layer and a P-type semiconductor layer formed on the growth substrate in sequence A step can be formed between the side of the P-type semiconductor layer away from the growth substrate and the side of the N-type semiconductor layer away from the growth substrate, the side of the P-type semiconductor layer away from the growth substrate is the upper step surface, and the side of the N-type semiconductor layer away from the growth One side of the substrate is the lower step surface, and the...
Embodiment 2
[0037] This embodiment provides a method for manufacturing the deep ultraviolet LED chip in Embodiment 1, including:
[0038] Step 1: forming an epitaxial layer on the growth substrate, the epitaxial layer includes an N-type semiconductor layer, a barrier layer 4, a light-emitting layer and a P-type semiconductor layer sequentially formed on the growth substrate;
[0039] Step 2: Deposit SIO on the surface of the P-type semiconductor layer away from the growth substrate 2 Protective layer 11, photolithography to make MESA pattern after coating positive resist, and remove excess SIO by wet method 2 part, forming the SIO 2 MESA graphics;
[0040] Step 3: Etching the epitaxial layer to the N-type semiconductor layer, forming the side of the step with an angle θ between the inclined surface and the horizontal plane, removing the photoresist, and the angle θ is 30-45 degrees;
[0041] Step 4: Change the etching gas and power ratio to perform secondary etching on the side between...
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Abstract
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