Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Integrated comprehensive test device and test method based on same

A comprehensive testing and testing technology, applied in electromagnetic wave transmission systems, electrical components, transmission systems, etc., can solve the problems of cumbersome and complicated operation process, affecting mass production efficiency, low testing efficiency, etc., to simplify testing operations and improve testing efficiency. , the effect of increasing yield

Active Publication Date: 2022-01-11
EVERPRO TECH COMPANY
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the implementation cost of the whole test is high, and the operation process is cumbersome and complicated, and the test efficiency is low, which affects the mass production efficiency.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Integrated comprehensive test device and test method based on same
  • Integrated comprehensive test device and test method based on same
  • Integrated comprehensive test device and test method based on same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of them. Based on the implementation manners in the present invention, all other implementation manners obtained by those skilled in the art without creative efforts shall fall within the protection scope of the present invention.

[0029] It should be understood that the terms "first", "second", "third" and "fourth" in the claims, description and drawings of the present invention are used to distinguish different objects, rather than to describe a specific order . The terms "comprising" and "comprising" used in the description and claims of the present invention indicate the presence of described features, integers, steps, operations, elements and / or components, but...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an integrated comprehensive test device and a test method based on same, and the integrated comprehensive test device comprises a control unit which is configured to obtain test information about an active optical cable to be tested and output a test instruction based on the test information; a low-speed signal testing unit which comprises a sub-testing unit and a signal source, the sub-testing unit is configured to receive a testing instruction and control the signal source to output a testing signal, and the testing signal is a low-speed protocol signal used for simulating handshake interaction between the active optical cable and equipment; an interface unit which is configured to receive and output the test signal to a to-be-tested active optical cable and output a feedback signal of the to-be-tested active optical cable to the sub-test unit; the sub-testing unit is further configured to test and analyze the feedback signal; and sending an analysis result of the feedback signal to the control unit. Through the device of the invention, the test of the low-speed protocol signal of the active optical cable can be supported, the test operation is effectively simplified, and the test efficiency is improved.

Description

technical field [0001] The present invention generally relates to the field of active optical cable technology. More specifically, the present invention relates to an integrated comprehensive testing device and a testing method based on the integrated comprehensive testing device. Background technique [0002] This section is intended to provide a background or context for implementations of the invention that are recited in the claims. The descriptions herein may include concepts that could be explored, but not necessarily concepts that have been previously thought of or explored. Therefore, unless otherwise indicated herein, what is described in this section is not prior art to the description and claims in this application and is not admitted to be prior art by inclusion in this section. [0003] In the era of big data, there are more and more high-density and high-bandwidth applications. At this time, passive optical cables or copper-based cable systems are stretched. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/079H04L43/18H04L43/20
CPCH04B10/07955H04L43/18H04L43/14
Inventor 邱宇为马燕周新亮
Owner EVERPRO TECH COMPANY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com