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Circuit breaker mechanism test monitoring device based on PLC

A circuit breaker mechanism and monitoring device technology, applied in the electrical field, can solve problems such as misidentification, abnormal opening, abnormal test process, etc., and achieve the effects of reducing dependence, ensuring performance stability, and ensuring quality and reliability

Pending Publication Date: 2022-01-18
XUJI GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The common abnormal types of circuit breaker mechanism are: 1. Closing and opening linkage abnormality: circuit breaker mechanism products require high reliability, and the abnormality that is prone to occur is that the failure of mechanical self-locking after the closing of the mechanism directly leads to the abnormality of opening. Since the whole process is completed in an instant, it is difficult to find this abnormality during the running-in test; 2. Other abnormalities in the testing process: due to the running-in test of the mechanism, in order to improve the operation efficiency, one person usually operates with multiple machines, and various abnormalities will occur during the process. And the running-in test of the organization is forced to be interrupted, and it is difficult for personnel to find this abnormality, which leads to

Method used

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  • Circuit breaker mechanism test monitoring device based on PLC
  • Circuit breaker mechanism test monitoring device based on PLC
  • Circuit breaker mechanism test monitoring device based on PLC

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Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.

[0026] The invention discloses a PLC-based circuit breaker mechanism test monitoring device, such as figure 2 As shown, specifically, the test monitoring device includes a power module (not shown in the figure), a PLC module 100 and a relay module 200 .

[0027] The running-in test process of the circuit breaker mechanism generally includes three actions of energy storage, closing and opening. Before running-in, install...

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Abstract

The invention relates to a circuit breaker mechanism test monitoring device based on a PLC. The circuit breaker mechanism test monitoring device comprises a power supply module, a PLC module and a relay module. The power supply module is connected with the circuit breaker mechanism and is used for supplying power to the circuit breaker mechanism, and the circuit breaker mechanism comprises an energy storage motor, a closing electromagnet and an opening electromagnet; the PLC module is connected with the relay module, and the relay module is connected with the circuit breaker mechanism and is used for controlling the circuit breaker mechanism to realize series actions of energy storage, closing and opening. The test monitoring device has the functions of circuit breaker running-in test energy storage, switching-on, switching-off and counting, and also has the function of automatically monitoring and alarming switching-on and switching-off linkage abnormity and other types of abnormity of a circuit breaker mechanism.

Description

technical field [0001] The invention relates to the field of electrical technology, in particular to a PLC-based circuit breaker mechanism test monitoring device. Background technique [0002] The common abnormal types of circuit breaker mechanism are: 1. Closing and opening linkage abnormality: circuit breaker mechanism products require high reliability, and the abnormality that is prone to occur is that the failure of mechanical self-locking after the closing of the mechanism directly leads to the abnormality of opening. Since the whole process is completed in an instant, it is difficult to find this abnormality during the running-in test; 2. Other abnormalities in the testing process: due to the running-in test of the mechanism, in order to improve the operation efficiency, one person usually operates with multiple machines, and various abnormalities will occur during the process. And the running-in test of the organization is forced to be interrupted, and it is difficult...

Claims

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Application Information

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IPC IPC(8): G05B19/05
CPCG05B19/054G05B2219/1108
Inventor 贾克元焦明青李帅男葛亚龙彭俊召郑召敏李召森冯忠祥
Owner XUJI GRP
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