High-precision device for vertically measuring outline of slender piece

A measuring device and high-precision technology, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems that the results are difficult to be consistent, the measurement accuracy of the shape and contour is difficult to improve, and there is no commercial instrument for the mandrel to meet the calibration or measurement needs. To achieve the effect of improving the accuracy

Pending Publication Date: 2022-01-25
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
View PDF0 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there are three types of devices used for high-precision measurement of slender parts. One is the cylindricity measuring instrument used for standard mandrel measurement. It can realize the movement and position measurement of the vertical and lateral probes with the horizontal moving guide rail, and then combine the high-precision inductive displacement sensor to realize the roundness and cylinder measurement of the mandrel standard parts or parts. Currently, the commercialization of the British Taylor hobson company 565 The /585H cylindricity meter can reach 1.2m, the Taylrond 450 can reach 1.5m in the vertical direction, and the YD1000 large-scale roundness meter produced by domestic Yanghui Intelligent Measurement and Control has a vertical measurement range of 1.0m, but The longer mandrel has not been seen in commercial instruments to meet the calibration or measurement needs; the second type is the instrument for quadrilateral or hexagonal nuclear fuel assembly measurement, this type of instrument uses a combination of vertical back frame and guide rail as a vertical movement hollow slide Benchmark guided by the table, through the inductive or grating pneumatic displacement sensors fixedly installed on the hollow slide table in a quadrilateral or hexagonal distribution to realize the measurement o...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-precision device for vertically measuring outline of slender piece
  • High-precision device for vertically measuring outline of slender piece
  • High-precision device for vertically measuring outline of slender piece

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The present invention will be further described below in conjunction with the accompanying drawings and implementation examples.

[0036] See attached figure 1 As shown, a device for vertically measuring the profile of a slender piece with high precision disclosed in this embodiment is mainly composed of four parts, one is a vertical reference guiding movement assembly 1, the other is a multi-dimensional measurement assembly 2, and the third is a rapid positioning Components 3 and 4 are motion control systems. The vertical reference guide movement assembly 1 is the basis of the measurement guidance of the entire measurement device, and is used to provide precision guide driving and collimated laser for deflection correction for the multi-size measurement assembly 2 and the rapid positioning assembly 3; The measurement component 2 is used to realize the precise measurement of the cross-sectional profile size of the measured object 108 at different vertical measurement p...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a high-precision device for vertically measuring the outline of a slender piece, and belongs to the field of measurement and detection in the manufacturing industry. The device is mainly composed of a vertical reference guide motion assembly, a multi-size measurement assembly, a rapid positioning assembly and a motion control system. The vertical reference guiding motion assembly is used for realizing guiding, motion driving and position measurement of the multi-size measurement assembly and the rapid positioning assembly. The rapid positioning assembly adopts a digital CCD and a two-dimensional movement reset scheme to realize rapid installation and positioning of a measured slender piece. The multi-size measurement assembly adopts a rotary non-contact scanning measurement scheme to measure the cross section size of the measured slender piece. According to the invention, rapid installation and positioning and high-precision profile measurement of circular, quadrilateral, hexagonal and other components and standard parts with slender cross sections in a vertical state can be realized, and the device has the advantages of high measurement precision, high universality and high measurement efficiency.

Description

technical field [0001] The invention belongs to the field of metrology and detection in the manufacturing industry, and relates to a device for vertically measuring the outline of a slender piece with high precision, in particular to a device directly applied to the outline height of slender vertical use pieces such as nuclear fuel assemblies and standard slender mandrels. Devices for precision measurement. Background technique [0002] In the field of metrology and testing in the manufacturing industry, high-precision standards are usually used to calibrate measuring instruments. For example, cylindricity measuring devices need to be calibrated with slender standard mandrels, and nuclear fuel assembly measuring instruments need standard nuclear fuel assemblies for calibration. Measuring instruments of different sizes require standards of different sizes, and elongated parts, especially those used vertically, require higher measuring devices to meet calibration requirements;...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01B11/24
CPCG01B11/24
Inventor 孙安斌高廷邹志马骊群乔磊曹铁泽王继虎甘晓川
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products