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Microscopic three-dimensional reconstruction method based on Markov random field constraint

A 3D reconstruction and random field technology, applied in 3D modeling, computer components, details involving processing steps, etc., can solve the problem that the focus evaluation function is difficult to balance the detection sensitivity and noise robustness, and improve the reconstruction ability , eliminate errors, and achieve the effect of simple principle

Pending Publication Date: 2022-01-25
杭州图谱光电科技有限公司
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Problems solved by technology

[0005] The purpose of the present invention is to provide a microscopic three-dimensional reconstruction method based on Markov random field constraints, which solves the problem that the focus evaluation function in the prior art is difficult to balance detection sensitivity and robustness to noise, and improves the Reconstruction Ability of Weakly Textured Samples

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  • Microscopic three-dimensional reconstruction method based on Markov random field constraint
  • Microscopic three-dimensional reconstruction method based on Markov random field constraint
  • Microscopic three-dimensional reconstruction method based on Markov random field constraint

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[0047] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, and do not limit the protection scope of the present invention.

[0048] This embodiment provides a microscopic three-dimensional reconstruction algorithm based on Markov random field constraints, including the following steps:

[0049] Step 1: Right figure 1 The sample shown builds a sequence of multifocus images.

[0050] Specifically, using a microscope and a scanning platform to build such figure 2The microscopic three-dimensional reconstruction system shown, with the help of the imaging characteristics of the small depth of field of the microscope, scans and images the sample to be tested by moving the scanning platform at equa...

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Abstract

The invention discloses a microscopic three-dimensional reconstruction method based on a Markov random field constraint. The method comprises the following steps: scanning and shooting an object by using a microscope to obtain a plurality of images with different focusing degrees, and forming a multi-focusing image sequence; performing non-subsampled contourlet transformation on each image in the image sequence, and constructing a low-pass filter bank distributed in a pyramid shape to process a non-subsampled contourlet transformation result; comparing different image processing results to obtain depth information and full-focus information implied in the image sequence; correcting the depth information by using the prior constraint of the Markov random field; and constructing a three-dimensional form of the microscopic image by using the depth information of the obtained multi-focus image sequence. The algorithm is simple in implementation principle and can be effectively applied to the fields of fine structure detection, ultra-precision machining, medical operation and the like. The method solves the problem that in the prior art, a focusing evaluation function is difficult to balance the detection sensitivity and the noise robustness, and improves the reconstruction capability of the weak texture sample.

Description

technical field [0001] The invention relates to technical fields such as digital image processing and computer vision, and in particular to a microscopic three-dimensional reconstruction method based on Markov random field constraints. Background technique [0002] The development of precision machining technology puts forward higher requirements for microscopic three-dimensional reconstruction technology. The key to 3D reconstruction technology is to accurately extract the depth information and all-focus information of the microscopic sample. In this case, due to the large measurement range of the focusing method and the low requirement for the smoothness of the surface of the sample to be tested, it has become a reliable method for quality inspection in the field of precision machining, especially for samples with large inclination angles such as cutting tools. detection. [0003] Although the focusing method has the ability to quickly obtain the depth information and al...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T17/00G06T19/20G06T7/55G06K9/62
CPCG06T17/00G06T19/20G06T7/55G06T2200/08G06T2207/10056G06F18/295
Inventor 尚明皓周海洋余飞鸿
Owner 杭州图谱光电科技有限公司
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