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Parameter determination method and device of impulse voltage test loop and computer equipment

A technology of impulse voltage and test circuit, which is applied in computer-aided design, CAD circuit design, calculation, etc., can solve the problems of a lot of time-consuming and low test efficiency, and achieve the effect of short time-consuming and flexible adjustment

Pending Publication Date: 2022-01-28
EXAMING & EXPERIMENTAL CENT OF ULTRAHIGH VOLTAGE POWER TRANSMISSION COMPANY CHINA SOUTHEN POWER GRID
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  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Large-scale impulse voltage generators often include hundreds of resistance values ​​that need to be adjusted, and the height of the equipment is high. It takes a lot of time to perform an electronic adjustment. During the test, it will go through multiple cycles of "adjustment-test-adjustment" , the test efficiency is very low

Method used

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  • Parameter determination method and device of impulse voltage test loop and computer equipment
  • Parameter determination method and device of impulse voltage test loop and computer equipment
  • Parameter determination method and device of impulse voltage test loop and computer equipment

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Embodiment Construction

[0043] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0044] In one embodiment, such as figure 1 As shown, a method for determining the parameters of the impulse voltage circuit is provided. This embodiment uses the method applied to the terminal as an example for illustration. It can be understood that the method can also be applied to the server, and can also be applied to the system, and is realized through the interaction between the terminal and the server. In this embodiment, the method includes the following steps:

[0045] S101. Acquire a parameter set of the impulse voltage test loop to be processed.

[0046] Wher...

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Abstract

The invention relates to a parameter determination method and device of an impulse voltage test loop and computer equipment. The method comprises the following steps: acquiring a parameter set of a to-be-processed impulse voltage test loop; establishing a simulation test loop based on the parameter set and the impulse voltage test loop, and determining an output waveform based on the simulation test loop; and if the output waveform does not meet the preset condition, adjusting the parameter set, repeating the process of determining the output waveform until the determined output waveform meets the preset condition, and taking the loop parameter set corresponding to the output waveform meeting the preset condition as a target parameter set. By adopting the method, the parameter set of the impulse voltage test loop meeting the requirements can be quickly and efficiently obtained.

Description

technical field [0001] The present application relates to the technical field of circuit design, in particular to a parameter determination method, device and computer equipment of an impulse voltage test circuit. Background technique [0002] When conducting the impulse voltage test, it is necessary to dynamically adjust the wave head and wave tail resistance values ​​inside the generator according to the parameters of the equipment, so that the system can output the required voltage waveform. [0003] Large-scale impulse voltage generators often include hundreds of resistance values ​​that need to be adjusted, and the height of the equipment is high. It takes a lot of time to perform an electronic adjustment. During the test, it will go through multiple cycles of "adjustment-test-adjustment" , the test efficiency is extremely low. Contents of the invention [0004] Based on this, it is necessary to provide a parameter determination method, device and computer equipment ...

Claims

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Application Information

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IPC IPC(8): G06F30/33G06F30/3323G06F30/333
CPCG06F30/33G06F30/333G06F30/3323
Inventor 何思靖周力骏陆海熊锦州袁瑞敏张秋实徐子健魏向阳张新波
Owner EXAMING & EXPERIMENTAL CENT OF ULTRAHIGH VOLTAGE POWER TRANSMISSION COMPANY CHINA SOUTHEN POWER GRID