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Semiconductor device

A technology of semiconductor and capping layer, which is applied in the direction of semiconductor devices, semiconductor/solid-state device manufacturing, transistors, etc., and can solve problems such as incompatibilities

Pending Publication Date: 2022-02-22
TAIWAN SEMICON MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

While existing dielectric fins are generally adequate for their intended purpose, they do not meet all requirements

Method used

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  • Semiconductor device
  • Semiconductor device
  • Semiconductor device

Examples

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Embodiment Construction

[0053] The following detailed description can be accompanied by accompanying drawings to facilitate understanding of various aspects of the present invention. It is worth noting that various structures are used for illustration purposes only and are not drawn to scale, as is the norm in the industry. In fact, the dimensions of the various structures may be arbitrarily increased or decreased for clarity of illustration.

[0054] Different embodiments or examples provided in the following content can implement different structures of the embodiments of the present invention. The examples of specific components and arrangements are used to simplify the disclosure and not to limit the invention. For example, the statement that the first component is formed on the second component includes that the two are in direct contact, or there are other additional components interposed between the two instead of direct contact.

[0055] In addition, spatial relative terms such as "below", ...

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Abstract

A semiconductor device of the present invention comprises: a dielectric fin comprising a cap layer; a gate structure on the first portion of the cap layer and extending in a direction; and a dielectric layer adjacent to the gate structure and on the second portion of the cap layer. The width of the first part in the direction is larger than that of the second part in the direction.

Description

technical field [0001] Embodiments of the present invention relate to dielectric fins and methods of forming the same to avoid gate shorting to source / drain of multi-bridge pass transistors. Background technique [0002] The semiconductor integrated circuit industry has experienced exponential growth. Technological advances in integrated circuit materials and design have resulted in each generation of integrated circuits having smaller and more complex circuits than the previous generation. In the evolution of integrated circuits, functional density (the number of interconnected devices per unit chip area) generally increases as the geometric size (eg, the smallest component or circuit that can be produced by the manufacturing process used) shrinks. A shrinking process is often beneficial for increased throughput and lower associated costs. Shrinking dimensions also increase the complexity of handling and manufacturing integrated circuits. [0003] For example, as integra...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/8234H01L27/088
CPCH01L21/823431H01L21/823481H01L27/0886H01L29/775H01L29/66545H01L29/7848H01L29/165H01L29/78696H01L29/42392H01L27/088H01L29/0673H01L29/66439B82Y10/00H01L29/1079H01L21/823437H01L29/785H01L2029/7858H01L29/6681
Inventor 吕侑珊杨崇巽赵高毅谢文兴郭俊铭王志庆彭远清
Owner TAIWAN SEMICON MFG CO LTD
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