PXI structure-based tacan signal speed parameter calibration method and device
A signal speed and calibration device technology, which is applied in the testing/calibration of speed/acceleration/shock measuring equipment, measuring devices, speed/acceleration/shock measurement, etc., can solve the problems of inability to perform effective calibration and low measurement accuracy, Achieve the effect of accurate and reliable value transmission, accurate positioning of amplitude point and low noise floor
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[0023] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0024] The purpose of the present invention is to provide a method for calibrating TACAN signal velocity parameters in view of the deficiencies of the above-mentioned prior art. The system is based on the system architecture of the PXI bus, which saves system volume, integrates test functions, and improves calibration accuracy. Degree, so that the TACAN signal speed parameters can be traced to the national standard.
[0025] In order to achieve the above object, the present invention comprises: system is by PXI chassis (1), PXI zero slot controller (2), PXI vector signal generator plate card (3), PXI signal analysis module (4), single directional coupler ( 5).
[0026] The present invention adopts the test system of PXI structure, utilizes trigger signal, carries out the storage measurement measurement of broadband high-speed signal, and the technical ...
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