Method for measuring transmittance of material by integrating sphere method and integrating sphere measuring device

Abstract

The invention belongs to the technical field of optical measurement, and particularly relates to a method for measuring the transmittance of a material by an integrating sphere method, a first light measuring device is arranged right in front of a sample mounting opening of an integrating sphere, a sample fixing piece is arranged between the first light measuring device and the sample mounting opening, and then a second light measuring device is mounted on the integrating sphere. The method can overcome the defects of an existing d / 0 measurement method, and the measurement precision is improved. The invention also discloses an integrating sphere measuring device, wherein the measuring integrating sphere is provided with a sample mounting port and a sample fixing piece. The device further comprises a first light measuring device and a main light source, the first light measuring device is located right in front of the sample installation opening, a sample is located on a measuring light path of the first light measuring device, and the device further comprises a second light measuring device. The device can be used for respectively measuring the difference of diffuse reflection conditions in the integrating sphere when the sample is placed on the sample fixing piece and when the sample is not placed on the sample fixing piece, then the difference is eliminated through calculation, and finally the accurate material transmittance is obtained.

Description

technical field [0001] The invention belongs to the technical field of optical measuring equipment, and specifically includes a method for measuring the transmittance of a material by an integrating sphere method and an integrating sphere measuring device. Background technique [0002] At present, the integrating sphere method is often used to measure the transmittance of materials. In CIE15, there are two methods involving the integrating sphere measurement method, one is (d / 0) diffuse / perpendicular measurement method, and the other is (0 / d) Vertical / diffuse measurement method. When the d / 0 method is used, a light source and a light outlet are set on the integrating sphere, the light emitted by the light source is reflected by the integrating sphere and then exits through the light outlet, and the sample to be measured is set at the light outlet of the integrating sphere, and the light outlet of the integrating sphere Set the light measuring instrument at the opposite pos...

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Problems solved by technology

[0003] In actual use, the state of the integrating sphere changes when the sample is placed or not. When there is a sample, the surface of the sample also constitutes a part of the inner wall of the integrating sphere, and the diffusion conditions in the integrating sphere are changed, resulting in the optical measurement device The change of the received optical signal cannot accurately reflect the transmittance of the material

[0004] In order to make up for this deficiency, the existing technology eliminates the difference between placing the sample and not placing the sample by opening a new compensation interface near the sample installation port of the integrating sphere. This method can largely eliminate the error, but it still cannot completely Make the diffusion conditions in the integrating sphere of the two states exactly the same

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