A fan-out packaging structure and its forming method
A packaging structure and sacrificial material layer technology, applied in semiconductor/solid-state device components, nanotechnology for materials and surface science, semiconductor devices, etc., can solve the problem of low stability of electrical connection structure and stability of semiconductor packaging structure reduce problems, achieve the effect of improving bendability, toughness and stability
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[0037] The flexible interconnect pattern layer and the insulating dielectric layer are alternately formed multiple times on the second sacrificial material layer, each layer of the
[0038] A plurality of semiconductor chips are arranged on the uppermost insulating medium layer, and each of the semiconductor chips includes
[0039] removing the temporary substrate, followed by forming a penetrating second sacrificial material layer and a
[0042] Wherein, the first sacrificial material layer is a metal material, and the second sacrificial material layer is an organic material and / or
[0043] Wherein, the aperture of the opening is smaller than the aperture of the first perforation.
[0045] Wherein, the shape of the first conductive pad is a circle or a square, the diameter or side of the first conductive pad
[0047] wherein, before depositing a conductive material in the first through hole to form a first conductive through hole, the first conductive through hole is removed
[00...
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