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Key factor automatic searching method based on machine learning

A key factor, automatic search technology, applied in the field of data mining, can solve problems such as consumption of human resources, abnormal yield, difficult to judge and so on

Pending Publication Date: 2022-04-08
AU OPTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If there are too many parameters, the method of confirming them one by one seems to consume too much human resources
In addition, traditional analysis methods are not easy to judge yield abnormality caused by more than one factor or nonlinear relationship

Method used

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  • Key factor automatic searching method based on machine learning
  • Key factor automatic searching method based on machine learning
  • Key factor automatic searching method based on machine learning

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Experimental program
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Embodiment Construction

[0029] figure 1 is a block diagram of an electronic device according to an embodiment of the present invention. Please refer to figure 1 , the electronic device 100 includes a processor 110 and a storage 120 . The processor 110 is coupled to the storage 120 . The processor 110 is, for example, a central processing unit (Central Processing Unit, CPU), a physical processing unit (Physics Processing Unit, PPU), a programmable microprocessor (Microprocessor), an embedded control chip, a digital signal processor (Digital Signal Processor, DSP ), Application Specific Integrated Circuits (Application Specific Integrated Circuits, ASIC) or other similar devices.

[0030] The storage 120 is, for example, any type of fixed or removable random access memory (Random Access Memory, RAM), read-only memory (Read-Only Memory, ROM), flash memory (Flash memory), hard disk or other similar devices or a combination of these devices. The storage 120 includes a modeling module 121 and an analy...

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Abstract

The invention provides an automatic key factor searching method based on machine learning. First, a training data set is collected. The training dataset includes a plurality of datasets and result values corresponding to the datasets. And then, establishing a machine learning model based on the training data set. Here, each data set is used as an input variable of the machine learning model, and a result value corresponding to each data set is used as an output variable of the machine learning model, thereby training the machine learning model. After the machine learning model is established, a model analysis method is executed on the machine learning model, so that at least one key factor influencing the result value is extracted from the data set.

Description

technical field [0001] The present invention relates to a data mining method, and in particular to a method for automatically finding key factors based on machine learning. Background technique [0002] With the rapid development of science and technology, the informatization level of various industries has been greatly improved, and the data of the whole society is growing at an unprecedented rate. And data mining is the product of the rapid growth of huge amounts of data. The overall goal of the data mining process is to extract information from a data set and transform it into an understandable structure. [0003] Generally used in factory yield analysis, when the production quality or performance is abnormal, the factory personnel will use the linear analysis method to judge the correlation between each parameter and the yield one by one. If there are too many parameters, the way of confirming them one by one seems to consume too much human resources. In addition, tra...

Claims

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Application Information

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IPC IPC(8): G06N20/00
Inventor 顾永庭程友信詹朝岩杨其勋郭智渊
Owner AU OPTRONICS CORP
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