Flying probe testing machine and testing shaft polarity distribution method thereof

Abstract

The invention discloses a flying probe testing machine and a testing shaft polarity distribution method thereof. The method comprises the following steps: establishing a conversion relation M12 between a first probe coordinate system and a second probe coordinate system, a moving path L11 from a first probe to a first to-be-measured point, and a moving path L22 from a second probe to a second to-be-measured point; whether interference exists between the moving path L11 and the moving path L22 or not is judged based on the conversion relation M12; and if interference exists between the moving path L11 and the moving path L22, taking the second to-be-tested point as a test point of the first probe, and taking the first to-be-tested point as a test point of the second probe, and carrying out probe placement test. According to the flying probe testing machine and the testing shaft polarity distribution method thereof, whether interference collision occurs in the testing shaft corresponding to the probe in the testing process can be judged according to the position and the corresponding relation between the testing point on the PCB and the corresponding probe, and the polarity of the testing shaft is distributed according to the judgment result, so that the testing accuracy is improved. Therefore, interference and collision of the test shaft during a lower needle test are avoided.

Description

technical field [0001] The invention relates to the technical field of flying probe testing, in particular to a flying probe testing machine and a test shaft polarity distribution method thereof. Background technique [0002] The PCB board flying probe test machine uses probes to replace the needle bed, and uses multiple motor-driven, fast-moving electrical probes to contact the pins of the device and perform automated testing. In the test process, the test axis is required to have the characteristics of high speed, high precision and wide test range. However, in the prior art, due to the problem of the spatial distribution of test points on the PCB, the test axis is prone to collision during high-speed operation. Once a collision occurs, huge property losses will occur. [0003] Therefore, in view of the above technical problems, it is necessary to provide a flying probe testing machine and a testing axis polarity distribution method thereof. Contents of the invention ...

AI Technical Summary

Problems solved by technology

However, in the prior art, due to the spatial distribution of the test points on the PCB board, the test axis is prone to collision during high-speed operation. Once a collision occurs, huge property losses will occur

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