Unlock instant, AI-driven research and patent intelligence for your innovation.

Capacitance film gauge, pressure measurement method, system, electronic device and storage medium

A measurement method and measurement system technology, which is applied in fluid pressure measurement using capacitance changes, measurement devices, and measurement of fluid pressure, etc., which can solve uneven deformation of diaphragms, inaccurate pressure values ​​of measured gases, and installation and use of capacitance film gauges. Inconvenience and other problems to achieve the effect of improving convenience

Active Publication Date: 2022-07-15
JIHUA LAB
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the capacitive film gauge is installed horizontally, under the influence of gravity, the deformation of the diaphragm is uneven, resulting in inaccurate measured gas pressure values ​​measured by the capacitive film gauge
Although the capacitance error generated by the external electrode can be reduced by zeroing the diaphragm, the diaphragm needs to be zeroed every time the installation orientation of the capacitive film gauge is changed, which makes the installation and use of the capacitive film gauge inconvenient
[0003] For the above problems, there is no effective technical solution

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capacitance film gauge, pressure measurement method, system, electronic device and storage medium
  • Capacitance film gauge, pressure measurement method, system, electronic device and storage medium
  • Capacitance film gauge, pressure measurement method, system, electronic device and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0067] The number of the first measurement electrodes 4 is an even number, and step S2 includes the following sub-steps:

[0068] S21, performing differential processing on the second measurement capacitance information generated by each group of symmetrically arranged first measurement electrodes 4 to generate multiple first differential results;

[0069] S22. If all the first difference results are less than or equal to the preset uniform threshold, the diaphragm 1 is deformed uniformly, and the pressure value is calculated according to any second measurement capacitance information and the first measurement capacitance information;

[0070] S23. If any of the first differential results is greater than the uniform threshold, the diaphragm 1 is not uniformly deformed, calculate the first average capacitance value according to the two second measured capacitance information corresponding to the largest first differential result, and calculate the first average capacitance accordi...

Embodiment 2

[0075] The number of the first measurement electrodes 4 is an even number, and step S2 includes the following sub-steps:

[0076] S21', performing differential processing on the second measurement capacitance information generated by each group of symmetrically arranged first measurement electrodes 4 to generate multiple second differential results;

[0077] S22': If all the second difference results are less than or equal to the preset uniform threshold, the diaphragm 1 is deformed uniformly, and the second average capacitance value is calculated according to the two second measured capacitance information corresponding to the smallest second difference result, and the second average capacitance value is calculated according to the first 2. Calculate the pressure value from the average capacitance value and the first measured capacitance information;

[0078] S23', if any second difference result is greater than the uniform threshold, the diaphragm 1 is not uniformly deformed...

Embodiment 3

[0082] The pressure measurement system also includes a plurality of second measurement electrodes 5, and the plurality of second measurement electrodes 5 are arranged in a circumferential array outside the first measurement electrodes 4, and the number of the second measurement electrodes 5 is the same as the number of the first measurement electrodes 4, And the first measurement electrodes 4 are staggered, and a plurality of second measurement electrodes 5 are used to generate corresponding third measurement capacitance information according to their distances from the diaphragm 1. The number of the first measurement electrodes 4 and the second measurement electrodes 5 are equal to each other. is an even number, step S2 includes the following sub-steps:

[0083] S21 ″, performing differential processing on the second measurement capacitance information generated by each group of symmetrically arranged first measurement electrodes 4 to generate a plurality of third differential...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
radiusaaaaaaaaaa
Login to View More

Abstract

The present application relates to the technical field of capacitive thin film gauges, and specifically provides capacitive thin film gauges, pressure measurement methods, systems, electronic equipment, and storage media, which are applied in pressure measurement systems. The pressure measurement system includes a diaphragm, a ceramic substrate, a fixed electrode, and a plurality of The first measurement electrode, the fixed electrode is used to generate the first measurement capacitance information according to its distance from the diaphragm, the circular array of the first measurement electrodes is outside the fixed electrode, and the plurality of first measurement electrodes are used respectively according to their distance from the diaphragm The corresponding second measurement capacitance information is generated, and the pressure measurement method includes the following steps: acquiring first measurement capacitance information and second measurement capacitance information; detecting whether the diaphragm deformation is uniform according to the second measurement capacitance information generated by the first measurement electrodes at different positions , and calculate the pressure value according to the first measurement capacitance information and several second measurement capacitance information; the method can realize the self-adaptive correction and measurement of the pressure value of the measured gas.

Description

technical field [0001] The present application relates to the technical field of capacitive thin film gauges, and in particular, to capacitive thin film gauges, pressure measurement methods, systems, electronic devices, and storage media. Background technique [0002] The capacitor film gauge in the prior art includes a casing, an elastic element (usually a metal diaphragm), a ceramic substrate and a fixed electrode. The diaphragm divides the casing into a measurement chamber and a reference chamber. The ceramic substrate is set in the reference chamber and the fixed electrode is set. On the end face of the ceramic substrate close to the diaphragm, the capacitance formed on the fixed electrode is related to the distance from the fixed electrode to the diaphragm. The working principle of the capacitive film gauge is: the gas to be measured is fed into the measuring chamber, ideally or after waiting for a long enough time, the gas to be measured is evenly mixed and the gas pre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01L9/12G01L27/00
CPCG01L9/12G01L27/005
Inventor 刘乔王凤双侯少毅黎天韵肖永能卫红胡强
Owner JIHUA LAB