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Panel anomaly detection display method and device, electronic equipment and storage medium

An anomaly detection and display method technology, applied in the direction of circuits, electrical components, electric solid devices, etc., can solve the problems of inaccuracy and easy loss of information, and achieve the effect of avoiding information loss

Pending Publication Date: 2022-05-27
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present application aims to provide a panel abnormality detection and display method, device, electronic equipment and storage medium, aiming to solve the problem that the panel abnormality detection and display method in the prior art is easy to lose information and not accurate enough

Method used

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  • Panel anomaly detection display method and device, electronic equipment and storage medium
  • Panel anomaly detection display method and device, electronic equipment and storage medium
  • Panel anomaly detection display method and device, electronic equipment and storage medium

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Embodiment Construction

[0062] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of this application.

[0063] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", " The orientation or positional relationship indicated by "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc. is based on the orientation shown in the drawings Or the positional relationship is only for the convenience of describing the pre...

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PUM

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Abstract

According to the panel anomaly detection display method and device, the electronic equipment and the storage medium provided by the embodiment of the invention, the panel is detected and repaired for multiple times, the detection and repair information corresponding to different processes is distinguished, and different information of the multiple times of detection and repair is integrated, so that the detection efficiency is improved. The final abnormal mark information or repair mark information contains the abnormal or repair result determined by the previous multiple times of detection and multiple times of repair; and meanwhile, only the abnormal mark information or repair mark information with higher priority is displayed. In this way, while the information of multiple times of detection and multiple times of repair is integrated, only the unique mark which contains all the information and has the highest priority is displayed on the panel, the abnormity and repair of the panel can be determined by using the finally displayed mark, and information loss and detection result difference caused by manual work are avoided.

Description

technical field [0001] The present application relates to the field of panel detection, and in particular, to a panel abnormality detection and display method, device, electronic device and storage medium. Background technique [0002] With the rapid development of display technology, currently commonly used display panels are developed from Liquid Crystal Display (LCD) to Organic Light-Emitting Diode (OLED). Compared with LCD, OLED is more sensitive to foreign matter, and the problem of bad defects is more prominent, especially the Mura problem. [0003] In the current abnormality detection of OLEDs, different detection stations operate independently, and according to their respective inspection logics, generate their respective defective candidate points for auxiliary determination of dots and lines. However, this kind of detection lacks information communication and auxiliary judgment between various detection sites. Although the information that needs to be judged is si...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/66H01L51/56
CPCH10K71/70H10K71/00
Inventor 吴少辉
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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