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Liquid crystal module aging test system

A technology of aging test and liquid crystal module, which is applied in the direction of instruments, nonlinear optics, optics, etc., can solve the problems of open fire, damage of liquid crystal module and aging test board, and achieve the effect of eliminating potential safety hazards and avoiding damage

Pending Publication Date: 2022-05-31
INTERFACE TECH CHENGDU CO LTD +3
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Based on this, it is necessary to address the potential safety hazards of liquid crystal modules and burn-in test boards that may be damaged or even open flames due to heat generation when large currents are caused by defective devices in the prior art during the aging test of the liquid crystal module. problem, provide a liquid crystal module aging test system that improves the above defects

Method used

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  • Liquid crystal module aging test system
  • Liquid crystal module aging test system
  • Liquid crystal module aging test system

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Embodiment Construction

[0031] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0032] In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", " Back", "Left", "Right", "Vertical", "Horizontal", "Top", "Bottom", "Inner", "Outer", "Clockwise", "Counte...

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Abstract

The invention relates to a liquid crystal module aging test system. The liquid crystal module aging test system comprises an aging test board which is used for being connected with a liquid crystal module and carrying out aging test on the liquid crystal module; the aging test board is provided with a WiFi module; and the aging monitoring server is in communication with the WiFi module, the WiFi module is used for transmitting aging test data to the aging monitoring server, and the aging monitoring server is used for monitoring the aging test data of the liquid crystal module in real time. According to the liquid crystal module aging test system, the aging test is carried out after the liquid crystal module is connected with the aging test board, and the aging test data is transmitted to the aging monitoring server in real time by using the WiFi module in the aging test process, so that the aging test process of the liquid crystal module is monitored in real time by using the aging monitoring server; undesirable phenomena of the device can be found in time, damage to the liquid crystal module and the aging test board can be avoided, and the potential safety hazard of open fire caused by heating is eliminated.

Description

technical field [0001] The invention relates to the technical field of liquid crystal display, in particular to a liquid crystal module aging test system. Background technique [0002] The TFT-LCD (Thin film transistor liquid crystal display, thin film transistor liquid crystal display) liquid crystal module needs to use the aging test board for aging test. During the burn-in test, the burn-in test board is connected to the liquid crystal module to be tested, thereby lighting up the liquid crystal module, and collecting various data during the working process of the liquid crystal module. However, it is impossible to monitor the burn-in test process in real time. When a large current is caused by defective components, it may cause damage to the liquid crystal module and the burn-in test board, and even cause safety hazards such as open flames due to heat generation. Contents of the invention [0003] Based on this, it is necessary to address the potential safety hazards o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 张登琦张郁川李璟林
Owner INTERFACE TECH CHENGDU CO LTD
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